JTCS -- Index by Author (Feb 1995; 109, Number 2)

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Year:		Vol:		Page:

Index by Author: Feb 1995; 109 (2) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Abe, Toshio [Full Text]; Absensur, Henry [Abstract] [Full Text]; Alfieri, Ottavio [Full Text]; Allen, Lee F. [Abstract] [Full Text]; Appelbaum, Azai [Full Text]; Armour, J. Andrew [Abstract] [Full Text]; Asai, Tohru [Abstract] [Full Text]
B: Bacal, Fernando [Abstract] [Full Text]; Baumann, F. Gregory [Abstract] [Full Text]; Blackstone, Eugene H. [Abstract] [Full Text]; Blakemore, William S. [Full Text]; Bocchi, Edimar A. [Abstract] [Full Text]; Bohn, Desmond [Abstract] [Full Text]; Bolling, Steven F. [Abstract] [Full Text]; Bond, Richard A. [Abstract] [Full Text]; Bos, Joanne [Abstract] [Full Text]; Boutin, Christine [Abstract] [Full Text]; Bove, Edward L. [Abstract] [Full Text]; Brillman, Jon [Abstract] [Full Text]; Brunsting, Louis A. [Abstract] [Full Text]; Burns, Paul G. [Abstract] [Full Text]; Buxton, Brian F. [Full Text]
C: Cairns, Ellen L. [Abstract] [Full Text]; Caldarone, Christopher A. [Abstract] [Full Text]; Calta, Carol [Abstract] [Full Text]; Cameron, E. W. J. [Abstract] [Full Text]; Campell, David N. [Abstract] [Full Text]; Cane, Michael [Abstract] [Full Text]; Cardinal, René [Abstract] [Full Text]; Carey, F. A. [Abstract] [Full Text]; Caspi, Joseph [Full Text]; Castañeda, Aldo R. [Abstract] [Full Text]; Castañeda, Aldo R. [Abstract] [Full Text]; Chan, Robert K. M. [Full Text]; Chen, Chao [Abstract] [Full Text]; Chowdhury, Nepal C. [Abstract] [Full Text]; Clark, Richard E. [Abstract] [Full Text]; Colan, Steven D. [Abstract] [Full Text]; Colan, Steven D. [Abstract] [Full Text]; Colvin, Stephen B. [Abstract] [Full Text]; Cox, Peter [Abstract] [Full Text]; Craig, S. R. [Abstract] [Full Text]; Crowley, Dennis C. [Abstract] [Full Text]
D: Dandan, Nazih [Abstract] [Full Text]; David, Tirone E. [Abstract] [Full Text]; Davis, Donalee A. [Abstract] [Full Text]; de Haan, J. [Full Text]; Deeb, G. Michael [Abstract] [Full Text]; Deeb, Nancy D. [Abstract] [Full Text]; Detterbeck, Frank C. [Abstract] [Full Text]; Dindy, Christine [Abstract] [Full Text]; Dolber, Paul C. [Abstract] [Full Text]
E: Edmunds, L. Henry [Full Text]; Edwards, Helen [Abstract] [Full Text]; Egan, Thomas M. [Abstract] [Full Text]
F: Feindel, Christopher M. [Abstract] [Full Text]; Ferguson, Mark K. [Abstract] [Full Text]; Fleming, Fiona [Abstract] [Full Text]; Fullerton, David A. [Abstract] [Full Text]; Furuse, Akira [Full Text]
G: Galloway, Aubrey C. [Abstract] [Full Text]; Gaudette, Glenn R. [Abstract] [Full Text]; Geary, Dennis [Abstract] [Full Text]; Grossi, Eugene A. [Abstract] [Full Text]; Grover, Frederick L. [Abstract] [Full Text]
H: Halpin, Dermot P. [Full Text]; Hanley, Frank L. [Abstract] [Full Text]; Hare, David L. [Full Text]; Harlan, John L. [Full Text]; Hennein, Hani A. [Abstract] [Full Text]
I: Ianuzzo, C. David [Abstract] [Full Text]; Ichihara, Toshihiko [Full Text]; Ito, Toshiaki [Full Text]
J: Jatene, Adib D. [Abstract] [Full Text]; Jenkins, Eric [Abstract] [Full Text]; Johnson, Thomas D. [Abstract] [Full Text]; Jonas, Richard A. [Abstract] [Full Text]
K: Kawasuji, Michio [Abstract] [Full Text]; Keane, John F. [Abstract] [Full Text]; Kirklin, John W. [Abstract] [Full Text]; Kohno, Tadasu [Full Text]; Krukenkamp, Irvin B. [Abstract] [Full Text]
L: Lackner, Rudy P. [Abstract] [Full Text]; Lacquet, Leon K. [Full Text]; LeBoutillier, Martin [Abstract] [Full Text]; Lefkowitz, Robert J. [Abstract] [Full Text]; Levitsky, Sidney [Abstract] [Full Text]; Locke, Marius [Abstract] [Full Text]; Lorusso, Roberto [Full Text]; Lovell, Mark R. [Abstract] [Full Text]
M: Mabuchi, Hiroshi [Abstract] [Full Text]; Machado-Macedo, Manuel [Abstract] [Full Text]; Magovern MD, George J. [Abstract] [Full Text]; Maisano, Francesco [Full Text]; Martins, Ana [Abstract] [Full Text]; Maseki, Takashi [Full Text]; Matoso-Ferreira, António [Abstract] [Full Text]; Matsumoto, Yasushi [Abstract] [Full Text]; Matsuura, Akio [Full Text]; Mayer, John E. [Abstract] [Full Text]; Mayer, John E. [Abstract] [Full Text]; McCrindle, Brian W. [Abstract] [Full Text]; McGrath, Lynn B. [Abstract] [Full Text]; McIntyre, Robert C. [Abstract] [Full Text]; Melo, João Q. [Abstract] [Full Text]; Meneghetti, José C. [Abstract] [Full Text]; Michler, Robert E. [Abstract] [Full Text]; Mick, Rosemarie [Abstract] [Full Text]; Milano, Carmelo A. [Abstract] [Full Text]; Mill, Michael R. [Abstract] [Full Text]; Mitchell, Max B. [Abstract] [Full Text]; Miyahara, Ken [Full Text]; Monteiro, Carolino [Abstract] [Full Text]; Moreira, Luiz Felipe P. [Abstract] [Full Text]; Mosca, Ralph S. [Abstract] [Full Text]; Myers, John L. [Full Text]
N: Nadeau, Réginald [Abstract] [Full Text]; Naka, Yoshifumi [Abstract] [Full Text]; Neves, José [Abstract] [Full Text]; Nicholson, Jeffrey [Full Text]
O: Ogden, W. David [Abstract] [Full Text]; Ohtsuka, Toshiya [Full Text]; Okamoto, Hiroshi [Full Text]; Oz, Mehmet C. [Abstract] [Full Text]
P: Pêgo-Fernandes, Paulo M. [Abstract] [Full Text]; Pagé, Pierre L. [Abstract] [Full Text]; Paradowski, Linda J. [Abstract] [Full Text]; Parish, Michael A. [Abstract] [Full Text]; Pinsky, David J. [Abstract] [Full Text]; Pomerantz, Marvin [Full Text]; Price, Trevor R. P. [Abstract] [Full Text]
Q: Quint, Leslie E. [Abstract] [Full Text]
R: Ramos, Sância [Abstract] [Full Text]; Reeder, Laurie B. [Abstract] [Full Text]; Rhodes, Larry A. [Abstract] [Full Text]; Rockman, Howard A. [Abstract] [Full Text]; Rueff, José [Abstract] [Full Text]
S: Sabiston, Sponsored by David C. [Abstract] [Full Text]; Sakakibara, Naoki [Abstract] [Full Text]; Santos, Ricardo [Abstract] [Full Text]; Savard, Pierre [Abstract] [Full Text]; Sawasaki, Masaru [Full Text]; Schulman, Joshua [Abstract] [Full Text]; Shields, Thomas W. [Full Text]; Shuren, Allison [Abstract] [Full Text]; Silverman, Norman A. [Full Text]; Smith, Craig R. [Abstract] [Full Text]; Spencer, Frank C. [Abstract] [Full Text]; Stern, David M. [Abstract] [Full Text]; Stolf, Noedir A. G. [Abstract] [Full Text]
T: Tabuchi, N. [Full Text]; Tabuchi, N. [Full Text]; Takemura, Hirofumi [Abstract] [Full Text]; Thompson, Jeanette T. [Abstract] [Full Text]
U: Urcelay, Gonzalo [Abstract] [Full Text]
V: van Oeveren, W. [Full Text]; van Oeveren, W. [Full Text]; Viana, João [Abstract] [Full Text]
W: Waldhausen, John A. [Full Text]; Walker, W. S. [Abstract] [Full Text]; Walsh, Edward P. [Abstract] [Full Text]; Watanabe, Yoh [Abstract] [Full Text]; Weiner, Meredith A. [Abstract] [Full Text]; Wernovsky, Gil [Abstract] [Full Text]; Wernovsky, Gil [Abstract] [Full Text]; Wernovsky, Gil [Abstract] [Full Text]; Westerman, Jan H. [Abstract] [Full Text]; Wilcox, Benson R. [Abstract] [Full Text]; Williams, David M. [Abstract] [Full Text]; Williams, William G. [Abstract] [Full Text]
Y: Yankaskas, James R. [Abstract] [Full Text]; Yano, Osvaldo J. [Abstract] [Full Text]; Yano, Tokujiro [Full Text]; Yasuura, Kenzo [Full Text]
Z: Zalstein, Eli [Full Text]; Zuker, Nili [Full Text]