JTCS -- Index by Author (Jun 1995; 109, Number 6)

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	Author:		Keyword(s):
Year:		Vol:		Page:

Index by Author: Jun 1995; 109 (6) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Aida, Shinsuke [Full Text]; Al-Marsafawy, Hala M. F. [Abstract] [Full Text]; Alessandrini, Francesca [Abstract] [Full Text]; Allen, Bradley S. [Abstract] [Full Text]; Allibardi, Sonia [Full Text]; Alonso, Anselmo [Abstract] [Full Text]; Anderson, Robert H. [Abstract] [Full Text]; Armstrong, C. Susan [Abstract] [Full Text]; Ashida, Yasushi [Full Text]
B: Bailey, Leonard L. [Abstract] [Full Text]; Balbarini, A. [Full Text]; Barra, J. A. [Abstract] [Full Text]; Benedetti, M. [Full Text]; Bezon, E. [Abstract] [Full Text]; Biancari, Fausto [Full Text]; Binder, Bernd R. [Abstract] [Full Text]; Boley, Theresa M. [Abstract] [Full Text]; Bolling, Kirk S. [Abstract] [Full Text]; Bourge, Robert C. [Abstract] [Full Text]; Butler, Keith W. [Abstract] [Full Text]
C: Calafiore, Antonio M. [Abstract] [Full Text]; Campbell, Colin S. [Full Text]; Carteaux, Jean Pierre [Full Text]; Casalini, Stefania [Full Text]; Casciani, Carlo Umberto [Full Text]; Cassano, Vincenzo [Full Text]; Cochran, Richard P. [Abstract] [Full Text]; Cook, J. [Abstract] [Full Text]; Cooper, J. D. [Abstract] [Full Text]; Corno, Antonio [Full Text]
D: D'Agostino, Richard S. [Abstract] [Full Text]; Danielson, Gordon K. [Abstract] [Full Text]; DeCampli, William M. [Abstract] [Full Text]; Deiraniya, Abdul K. [Full Text]; Deslauriers, Roxanne [Abstract] [Full Text]; Di Benedetto, Giuseppe [Full Text]; Dowling, Robert D. [Full Text]; Driscoll, David D. [Abstract] [Full Text]
E: Early, Lesley [Abstract] [Full Text]; Eddy, A. Craig [Abstract] [Full Text]; Eke, Clifford C. [Abstract] [Full Text]; Ellis, Jonathan R. [Abstract] [Full Text]
F: Fantino, Giovanni [Abstract] [Full Text]; Fehr, Jörg [Abstract] [Full Text]; Feinstein, Steven [Abstract] [Full Text]; Ferguson, Mark K. [Abstract] [Full Text]; Ferson, Peter F. [Abstract] [Full Text]; Fleming, William H. [Abstract] [Full Text]; Fukushima, Norihide [Abstract] [Full Text]
G: Galbraith, Timothy A. [Abstract] [Full Text]; Gamel, Ahmed El [Full Text]; Geddes, L. A. [Abstract] [Full Text]; Graeter, Uwe [Abstract] [Full Text]; Griffith, Bartley P. [Full Text]; Grob, Peter [Abstract] [Full Text]; Gundry, Steven R. [Abstract] [Full Text]
H: Häussinger, Karl [Abstract] [Full Text]; Haga, Yoshiyuki [Full Text]; Ham, Jongwok [Abstract] [Full Text]; Hammon, John W. [Abstract] [Full Text]; Hanafy, Hanafy [Abstract] [Full Text]; Hara, Yohichi [Full Text]; Hardesty, Robert L. [Full Text]; Hartz, Renee S. [Abstract] [Full Text]; Hatori, Nobuo [Full Text]; Hazelrigg, Steven R. [Abstract] [Full Text]; Heller, Wolfgang [Abstract] [Full Text]; Hill, Arthur C. [Abstract] [Full Text]; Hinds, M. [Abstract] [Full Text]; Ho, Siew Yen [Abstract] [Full Text]; Ho, Jonathan K. S. [Full Text]; Hofer, Bradley O. [Abstract] [Full Text]; Hoffmeister, Hans-Eberhardt [Abstract] [Full Text]; Hoffmeister, Hans-Martin [Abstract] [Full Text]; Hottier, Etienne [Full Text]; Hubert, Thierry [Full Text]; Hudspeth, Dudley A. [Abstract] [Full Text]; Hunt, Sharon [Abstract] [Full Text]
I: Ikawa, Seiichiro [Abstract] [Full Text]; Ishiguro, Shingo [Full Text]; Izbicki, Jakob R. [Abstract] [Full Text]
J: Janas, W. [Abstract] [Full Text]
K: Kawashima, Yasunaru [Abstract] [Full Text]; Kirklin, James K. [Abstract] [Full Text]; Knott-Craig, Christopher J. [Abstract] [Full Text]; Kobayashi, Junjiro [Abstract] [Full Text]; Kunzelman, Karyn S. [Abstract] [Full Text]; Kuroda, Hiroaki [Full Text]
L: Landreneau, Rodney J. [Abstract] [Full Text]; Larcan, Alain [Full Text]; LoCicero, Joseph [Abstract] [Full Text]; Luikart, Helen [Abstract] [Full Text]
M: Mack, Michael J. [Abstract] [Full Text]; Mansourati, J. [Abstract] [Full Text]; Martin, David T. [Abstract] [Full Text]; Masiello, Paolo [Full Text]; Matsuda, Hikaru [Abstract] [Full Text]; Mayer, Gabriel [Abstract] [Full Text]; McCully, James D. [Abstract] [Full Text]; McGee, D. Scott [Abstract] [Full Text]; McGiffin, David C. [Abstract] [Full Text]; Melioli, Giovanni [Abstract] [Full Text]; Mereu, Carlo [Abstract] [Full Text]; Mertes, Paul Michel [Full Text]; Mezzetti, Andrea [Abstract] [Full Text]; Michel, Josef [Abstract] [Full Text]; Mihaljevic, Tomislav [Abstract] [Full Text]; Mineo, Tommaso Claudio [Full Text]; Minuti, Paolo [Abstract] [Full Text]; Mirabelli, Sandro [Abstract] [Full Text]; Mondine, P. [Abstract] [Full Text]; Mori, Tohru [Full Text]; Moulton, Anthony L. [Abstract] [Full Text]
N: Naftel, David C. [Abstract] [Full Text]; Nakanishi, Katsuhiko [Abstract] [Full Text]; Nakano, Susumu [Abstract] [Full Text]; Naunheim, Keith S. [Abstract] [Full Text]; Nitta, Kazutoyo [Full Text]; Noceti, Paolo [Abstract] [Full Text]; Nohara, Hideaki [Abstract] [Full Text]
O: Ochoa, L. [Abstract] [Full Text]; Ochsenfahrt, Christoph [Abstract] [Full Text]; Okada, Masayoshi [Abstract] [Full Text]; Orringer, Mark B. [Full Text]; Ota, Toshiaki [Abstract] [Full Text]
P: Paine, Thomas D. [Abstract] [Full Text]; Pantel, Klaus [Abstract] [Full Text]; Pasic, Miralem [Abstract] [Full Text]; Passlick, Bernward [Abstract] [Full Text]; Patterson, G. A. [Abstract] [Full Text]; Petronio, A. S. [Full Text]; Pinelli, Georges [Full Text]; Ponte, Marco [Abstract] [Full Text]; Pratali, S. [Full Text]; Puga, Francisco J. [Abstract] [Full Text]
R: Rahman, Ali N. [Full Text]; Ratto, Giovanni B. [Abstract] [Full Text]; Redington, Andrew N. [Abstract] [Full Text]; Reed, Elizabeth C. [Abstract] [Full Text]; Richardson, G. [Abstract] [Full Text]; Robinson, Lary A. [Abstract] [Full Text]; Rovida, Salvatore [Abstract] [Full Text]; Rukbi, I. [Abstract] [Full Text]
S: Salerno, Tomás A. [Abstract] [Full Text]; Samaja, Michele [Full Text]; Sarsam, Mazin A. [Full Text]; Sasaki, Shigeyuki [Abstract] [Full Text]; Savunen, Timo [Abstract] [Full Text]; Schaff, Hartzell V. [Abstract] [Full Text]; Schulze, Jochen [Abstract] [Full Text]; Scioti, G. [Full Text]; Scully, Hugh E. [Abstract] [Full Text]; Segawa, Daisuke [Full Text]; Seifert, Burkhardt [Abstract] [Full Text]; Semenkovich, J. [Abstract] [Full Text]; Shahian, David M. [Abstract] [Full Text]; Shimazaki, Yasuhisa [Abstract] [Full Text]; Sievers, Hans H. [Full Text]; Sisto, Tero [Abstract] [Full Text]; Stark, J. [Full Text]; Stinson, Edward B. [Abstract] [Full Text]; Sundaresan, S. [Abstract] [Full Text]; Svensson, Lars G. [Abstract] [Full Text]
T: Tönz, Martin [Abstract] [Full Text]; Tanaka, Susumu [Full Text]; Tassara, Elisabetta [Abstract] [Full Text]; Thetter, Olaf [Abstract] [Full Text]; Tian, Ganghong [Abstract] [Full Text]; Trulock, E. P. [Abstract] [Full Text]; Turina, Marko [Abstract] [Full Text]
V: van Son, Jacques A. M. [Full Text]; Venditti, Ferdinand J. [Abstract] [Full Text]; Verna, Anna [Abstract] [Full Text]; Verrier, Edward D. [Abstract] [Full Text]; Villemot, Jean Pierre [Full Text]; Vinten-Johansen, J. [Abstract] [Full Text]; von Segesser, Ludwig K. [Abstract] [Full Text]
W: Weaver, Amy L. [Abstract] [Full Text]; Wendel, Hans Peter [Abstract] [Full Text]; White-Williams, Connie [Abstract] [Full Text]; Williams, Penny [Full Text]; Williamson, Warren A. [Abstract] [Full Text]; Winkelmann, Jacqueline W. [Abstract] [Full Text]; Wojewski, Paul A. [Full Text]; Wojta, Johann [Abstract] [Full Text]
X: Xiang, Bo [Abstract] [Full Text]
Y: Yim, Anthony P. C. [Full Text]; Yim, Anthony P. C. [Full Text]; Yonan, Nizar A. [Full Text]; Yoshimura, Naoki [Abstract] [Full Text]; Yoshizu, Hiroshi [Full Text]; Youssef, Y. [Abstract] [Full Text]
Z: Zenati, Marco [Full Text]; Zhang, Jing Chuan [Abstract] [Full Text]; Zhao, Zhi-Qing [Abstract] [Full Text]; Zino, Paolo [Abstract] [Full Text]; Zuppan, Craig [Abstract] [Full Text]