JTCS -- Index by Author (Jul 1995; 110, Number 1)

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Year:		Vol:		Page:

Index by Author: Jul 1995; 110 (1) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Actis Dato, Guglielmo M. [Full Text]; Adachi, Hideo [Abstract] [Full Text]; Adler, Stuart [Abstract] [Full Text]; Aharinejad, S. [Abstract] [Full Text]; Aitken, Geri Lynn [Abstract] [Full Text]; Alsoufiev, A. [Abstract] [Full Text]; Amano, Jun [Abstract] [Full Text]; Armiger, Lois C. [Full Text]; Armiger, Lois [Full Text]; Armitage, John M. [Abstract] [Full Text]; Aronov, Alexander [Abstract] [Full Text]
B: Bailey, Leonard L. [Abstract] [Full Text]; Bando, Ko [Abstract] [Full Text]; Barratt-Boyes, Brian [Full Text]; Ben Ze'ev, Ilan [Full Text]; Benditt, David G. [Abstract] [Full Text]; Bleese, Niels [Full Text]; Boehm, D. H. [Full Text]; Bogers, Ad J. J. J. C. [Full Text]; Boutten, Anne [Full Text]; Boyland, Eileen [Abstract] [Full Text]; Braun, J. [Abstract] [Full Text]; Bremner, Cedric G. [Abstract] [Full Text]; Brewer, Jill M. [Abstract] [Full Text]; Burkhoff, Daniel [Abstract] [Full Text]; Byrne, Theresa [Abstract] [Full Text]
C: Camacho, Crescencio [Full Text]; Cavazos, Kerry A. [Abstract] [Full Text]; Chaparro, C. [Abstract] [Full Text]; Chen, Jonathen M. [Abstract] [Full Text]; Choi, Dennis W. [Abstract] [Full Text]; Chollet-Martin, Sylvie [Full Text]; Christie, Grant [Full Text]; Close, John M. [Abstract] [Full Text]; Coleman, R. Edward [Abstract] [Full Text]; Cornelisse, C. J. [Abstract] [Full Text]; Cosgrove, Delos M. [Abstract] [Full Text]; Cronin, Christopher S. [Abstract] [Full Text]
D: Dale, Paul S. [Abstract] [Full Text]; Dato, Alberto Actis [Full Text]; Davis, John Mihran [Full Text]; de Artaza, Manuel [Full Text]; de Hoyos, A. L. [Abstract] [Full Text]; Dehoux, Monique [Full Text]; DeMeester, Tom R. [Abstract] [Full Text]; Deslauriers, Roxanne [Abstract] [Full Text]; Desmonts, Jean-Marie [Full Text]; Despotis, G. J. [Abstract] [Full Text]; Ding, Jia-Zhen [Abstract] [Full Text]; Duhaylongsod, Francis G. [Abstract] [Full Text]; Duquesnoy, Rene J. [Abstract] [Full Text]; Durand, Geneviève [Full Text]
E: Einzig, Stanley [Abstract] [Full Text]
F: Ferguson, Colin [Full Text]; Ferrans, Victor J. [Abstract] [Full Text]; Filgueiras, Carlos L. [Abstract] [Full Text]; Forbess, Joseph M. [Abstract] [Full Text]; Fortney, James E. [Abstract] [Full Text]; Fortunato, Guglielmo [Full Text]; Fujiwara, Toshihumi [Abstract] [Full Text]; Fusazaki, Naoki [Full Text]
G: Gadaleta, Dominick [Full Text]; Goffin, Y. A. [Abstract] [Full Text]; Gonzalez, Jorge [Abstract] [Full Text]; Goodnough, L. T. [Abstract] [Full Text]; Goto, Katsutoshi [Full Text]; Griffith, Bartley P. [Abstract] [Full Text]; Gundry, Steven R. [Abstract] [Full Text]; Gustafson, Robert A. [Abstract] [Full Text]
H: Hardesty, Robert L. [Abstract] [Full Text]; Hazekamp, M. G. [Abstract] [Full Text]; Heimbucher, Johannes [Abstract] [Full Text]; Hein, Stefan [Abstract] [Full Text]; Helfrich, Loring R. [Abstract] [Full Text]; Heric, Blaine [Abstract] [Full Text]; Herridge, M. S. [Abstract] [Full Text]; Hill, Arthur C. [Abstract] [Full Text]; Hiramatsu, Takeshi [Abstract] [Full Text]; Hitomi, Shigeki [Abstract] [Full Text]; Hogue, C. W. [Abstract] [Full Text]; Honda, Sonao [Full Text]; Huysmans, H. A. [Abstract] [Full Text]; Hvass, Ulrich [Full Text]
I: Imamura, Hiroji [Abstract] [Full Text]; Inagaki, Chiyoko [Abstract] [Full Text]; Ino, Takashi [Abstract] [Full Text]; Inui, Kenji [Abstract] [Full Text]; Ireland, Adrian P. [Abstract] [Full Text]; Ishikawa, Shiro [Full Text]; Iwakura, Atsushi [Full Text]
J: Jobes, David R. [Abstract] [Full Text]; Joist, J. H. [Abstract] [Full Text]; Jones, Michael [Abstract] [Full Text]
K: Kado, Hideaki [Full Text]; Kashem, Mohammed A. [Full Text]; Kater, K. [Abstract] [Full Text]; Kauer, Werner K. H. [Abstract] [Full Text]; Kaukoranta, Päivi [Abstract] [Full Text]; Kawahito, Koji [Abstract] [Full Text]; Kawakami, Masanobu [Abstract] [Full Text]; Keenan, Robert J. [Abstract] [Full Text]; Kesten, S. [Abstract] [Full Text]; Khaghani, Asghar [Abstract] [Full Text]; Ko, Tokumitsu [Abstract] [Full Text]; Kobzik, Lester [Abstract] [Full Text]; Komatsu, Kanshi [Abstract] [Full Text]; Konishi, Hiroaki [Abstract] [Full Text]; Koolbergen, D. R. [Abstract] [Full Text]; Kormann, Joachim [Full Text]; Kouchoukos, Nicholas T. [Abstract] [Full Text]; Kozlowski, Piotr [Abstract] [Full Text]; Kudlak, John J. [Abstract] [Full Text]; Kusuhara, Kenji [Full Text]
L: Löwer, Christine [Full Text]; Lappas, D. G. [Abstract] [Full Text]; Larson, E. K. [Abstract] [Full Text]; Lasley, Robert D. [Abstract] [Full Text]; Lasley, Robert D. [Full Text]; Lepojärvi, Martti [Abstract] [Full Text]; Lever, Harry M. [Abstract] [Full Text]; Levin, Howard R. [Abstract] [Full Text]; Lipsitz, Evan C. [Abstract] [Full Text]; Lobner, Douglas C. [Abstract] [Full Text]; Lowe, Val J. [Abstract] [Full Text]; Lund, Ole [Abstract] [Full Text]; Lytle, Bruce W. [Abstract] [Full Text]
M: Müller-Berghaus, Gert [Full Text]; Manzetti, Jan [Abstract] [Full Text]; Marks, S. C. [Abstract] [Full Text]; Marumo, Fumiaki [Abstract] [Full Text]; Matsumura, Masahiko [Abstract] [Full Text]; Matsuyama, Katsuhiko [Abstract] [Full Text]; Maurer, J. R. [Abstract] [Full Text]; Mayer, John E. [Abstract] [Full Text]; Mentzer, Robert M. [Abstract] [Full Text]; Miki, Shigehito [Abstract] [Full Text]; Miksovsky, A. [Abstract] [Full Text]; Miller, Dave P. [Abstract] [Full Text]; Mitchell, Andrew [Abstract] [Full Text]; Mitchell, Ian M. [Full Text]; Miura, Takuya [Abstract] [Full Text]; Miyauchi, Yoshimasa [Full Text]; Miyauchi, Takashi [Full Text]; Moggio, Richard A. [Abstract] [Full Text]; Molina, José-Miguel [Full Text]; Molina, J. Ernesto [Abstract] [Full Text]; Morrissey, Thomas [Abstract] [Full Text]; Morton, Donald L. [Abstract] [Full Text]; Mukai, Tomoichiro [Full Text]; Muro, Kotaro [Abstract] [Full Text]
N: Nakamura, Tatsuo [Full Text]; Nissinen, Juha [Abstract] [Full Text]; Nitta, Takashi [Abstract] [Full Text]; Nomura, Fumikazu [Abstract] [Full Text]
O: O'Leary, Michael J. [Full Text]; Oakley, R. El [Full Text]; Okada, Masayoshi [Full Text]; Okita, Yutaka [Abstract] [Full Text]; Omori, Kyoko [Abstract] [Full Text]; Ono, Nobuhiro [Abstract] [Full Text]; Ortigosa, Javier [Full Text]; Otani, Hajime [Abstract] [Full Text]; Oteo, Juan-Francisco [Full Text]; Oz, Mehmet C. [Abstract] [Full Text]
P: Pötzsch, Bernd [Full Text]; Paradis, Irvin L. [Abstract] [Full Text]; Patz, Edward F. [Abstract] [Full Text]; Peters, Jeffrey H. [Abstract] [Full Text]; Peuhkurinen, Keijo [Abstract] [Full Text]; PhD, [Full Text]; Philip, Ivan [Full Text]; Pyles, Lee A. [Abstract] [Full Text]
R: Radley-Smith, Rosemary [Abstract] [Full Text]; Rainio, Pekka [Abstract] [Full Text]; Ramming, Kenneth P. [Abstract] [Full Text]; Randhawa, Mohinder P. S. [Abstract] [Full Text]; Rasmi, Nasser R. H. [Abstract] [Full Text]; Razzouk, Anees J. [Abstract] [Full Text]; Reed, George E. [Abstract] [Full Text]; Reichart, B. [Full Text]; Richards, William G. [Abstract] [Full Text]; Riess, Friedrich-Christian [Full Text]; Rizzo, Robert [Abstract] [Full Text]; Rokkas, Chris K. [Abstract] [Full Text]; Rosenblum, M. [Abstract] [Full Text]; Rosenkranz, Eliot R. [Abstract] [Full Text]
S: Sagawa, Kouichi [Full Text]; Sakai, Tetsuro [Abstract] [Full Text]; Sakai, Satoshi [Full Text]; Salerno, Tomas A. [Abstract] [Full Text]; Santoro, S. A. [Abstract] [Full Text]; Saunders, John K. [Abstract] [Full Text]; Schaper, Jutta [Abstract] [Full Text]; Scheffold, Thomas [Abstract] [Full Text]; Schraufnagel, D. E. [Abstract] [Full Text]; Scott, Jack [Abstract] [Full Text]; Seelig, Christoph [Full Text]; Serrano-Fiz, Santiago [Full Text]; Shabnavard, Laleh [Abstract] [Full Text]; Shaffer, Gene W. [Abstract] [Full Text]; Shichiri, Masayoshi [Abstract] [Full Text]; Shiraishi, Shoichiro [Full Text]; Similo, Shari [Abstract] [Full Text]; Sjolander, Matts [Abstract] [Full Text]; Slater, James P. [Abstract] [Full Text]; Smith, Carolyn J. [Abstract] [Full Text]; Sormunen, Raija [Abstract] [Full Text]; Spitznagel, E. [Abstract] [Full Text]; Stamler, Jonathan S. [Abstract] [Full Text]; Stemerman, Michael B. [Abstract] [Full Text]; Sugarbaker, David J. [Abstract] [Full Text]; Sugihara, H. [Abstract] [Full Text]; Sugishita, Yasuro [Full Text]; Summa, Michele Di [Full Text]; Summers, Randy [Abstract] [Full Text]; Sunagawa, Hiroshi [Full Text]; Sunamori, Makoto [Abstract] [Full Text]; Sundt, Thoralf M. [Abstract] [Full Text]; Suzuki, Akio [Abstract] [Full Text]
T: Tafra, Lorraine [Abstract] [Full Text]; Tahata, Takafumi [Abstract] [Full Text]; Tamura, Tokio [Abstract] [Full Text]; Tamura, Koichi [Abstract] [Full Text]; Tota, Robert R. [Abstract] [Full Text]; Tsukube, Takuro [Full Text]
U: Ueda, Yuichi [Abstract] [Full Text]; Ueno, Hayao [Full Text]; Urschel, John D. [Full Text]; Ushinohama, Hiroya [Full Text]; Utoh, Junichi [Full Text]
V: Van Arsdell, Glen [Abstract] [Full Text]; Vaughn, Anna L. [Abstract] [Full Text]; Vyhmeister, Edwin E. [Abstract] [Full Text]
W: Wada, Hiromi [Abstract] [Full Text]; Wanek, Leslie A. [Abstract] [Full Text]; Wang, Nan [Abstract] [Full Text]; Wilmore, Douglas [Abstract] [Full Text]; Winsborrow, BeAtrice [Abstract] [Full Text]; Winton, T. L. [Abstract] [Full Text]; Wolfe, Walter G. [Abstract] [Full Text]
Y: Yacoub, Magdi [Abstract] [Full Text]; Yamada, Izumi [Abstract] [Full Text]; Yamaguchi, Iwao [Full Text]; Yamamoto, Tetsuro [Full Text]; Ye, Jian [Abstract] [Full Text]; Yodoi, Junji [Abstract] [Full Text]; Yokomise, Hiroyasu [Abstract] [Full Text]; Yousem, Samuel A. [Abstract] [Full Text]
Z: Zattera, Giuseppe [Full Text]; Zeevi, Adriana [Abstract] [Full Text]; Zullo, Thomas G. [Abstract] [Full Text]