JTCS -- Index by Author (Aug 1995; 110, Number 2)

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Year:		Vol:		Page:

Index by Author: Aug 1995; 110 (2) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | 6

A: Abd-Elfattah, Anwar S. [Abstract] [Full Text]; Abe, Tadaaki [Full Text]; Akins, Cary W. [Full Text]; Amihai, Dina [Abstract] [Full Text]; Anderson, Robert H. [Abstract] [Full Text]; Anderson, Robert H. [Abstract] [Full Text]; Anderson, Robert H. [Abstract] [Full Text]; Anderson, Robert H. [Full Text]; Anderson, Richard P. [Abstract] [Full Text]; Arsiwala, Saify [Full Text]; Aufiero, Thomas X. [Full Text]; Avanessian, Raymond [Abstract] [Full Text]
B: Balfe, Dennis [Abstract] [Full Text]; Bayasi, G. [Abstract] [Full Text]; Bentley, C. [Abstract] [Full Text]; Bentley, C. [Abstract] [Full Text]; Beppu, Toshiyuki [Abstract] [Full Text]; Bethel, Kelly J. [Full Text]; Bianco, Richard W. [Abstract] [Full Text]; Björk, Viking O. [Abstract] [Full Text]; Boineau, John P. [Abstract] [Full Text]; Boineau, John P. [Abstract] [Full Text]; Bolman, R. Morton [Abstract] [Full Text]; Bove, Edward L. [Full Text]; Buchan, A. M. [Abstract] [Full Text]; Buchan, A. M. [Abstract] [Full Text]; Bustami, Mahmud [Abstract] [Full Text]; Buyse, Marc [Abstract] [Full Text]
C: Çiçek, Sertaç [Full Text]; Campbell, David B. [Full Text]; Chen, Chih-Yi [Abstract] [Full Text]; Chicago, [Full Text]; Clack, Rosemarie W. [Abstract] [Full Text]; Cohn, Lawrence H. [Abstract] [Full Text]; Costa, Robert [Full Text]; Costard-Jäckle, Angelika [Full Text]; Cotrufo, Maurizio [Full Text]; Cox, James L. [Abstract] [Full Text]; Cox, James L. [Abstract] [Full Text]; Cox, James L. [Abstract] [Full Text]; Crawford, Fred A. [Abstract] [Full Text]; Cremer, Joachim [Full Text]; Creswell, Lawrence L. [Abstract] [Full Text]; Cunningham, Joseph N. [Abstract] [Full Text]
D: Davies, Mike [Full Text]; Dawson, Christopher A. [Abstract] [Full Text]; de Luca, Luigi [Full Text]; Demirklç, Ufuk [Full Text]; Devine, William A. [Abstract] [Full Text]; Devine, William A. [Abstract] [Full Text]; Ding, Mai [Abstract] [Full Text]; Dubaybo, B. A. [Abstract] [Full Text]; Duran, Carlos M. G. [Abstract] [Full Text]
E: Edwards, Jesse E. [Abstract] [Full Text]
F: Ferguson, T. Bruce [Abstract] [Full Text]; Ferson, Peter F. [Abstract] [Full Text]; Firmin, Richard [Full Text]; Fosburg, Richard G. [Abstract] [Full Text]; Freeman, Richard K. [Full Text]; Fremes, Stephen E. [Abstract] [Full Text]; Furukawa, Robert D. [Abstract] [Full Text]
G: Gable, Preston S. [Full Text]; Gallo, Ricardo [Abstract] [Full Text]; Gometza, Begonia [Abstract] [Full Text]; Goto, Hiraaki [Full Text]; Grimm, Michael [Abstract] [Full Text]; Grimm, Georg [Abstract] [Full Text]
H: Habekost, Michael [Abstract] [Full Text]; Hammon, John W. [Abstract] [Full Text]; Harringer, Wolfgang [Full Text]; Hasegawa, S. [Abstract] [Full Text]; Haverich, Axel [Full Text]; Hazelrigg, Stephen R. [Abstract] [Full Text]; Hertz, Marshall I. [Abstract] [Full Text]; Higashidate, Masafumi [Abstract] [Full Text]; Hirata, Tomomi [Full Text]; Hirt, Stephan W. [Full Text]; Hitomi, S. [Abstract] [Full Text]; Ho, Siew Yen [Abstract] [Full Text]; Ho, Siew Yen [Abstract] [Full Text]; Hogue, Charles W. [Abstract] [Full Text]; Holmgren, Alf [Abstract] [Full Text]; Howden, Frederick M. [Full Text]; Hsu, Chung-Ping [Abstract] [Full Text]; Hsu, Nan-Yung [Abstract] [Full Text]
I: Ilsley, Charles D. J. [Abstract] [Full Text]; Imai, Yasuharu [Abstract] [Full Text]; Inui, K. [Abstract] [Full Text]; Ivert, Torbjörn [Abstract] [Full Text]; Izbicki, Jakob R. [Abstract] [Full Text]
J: Jaquiss, Robert D. B. [Abstract] [Full Text]; Jaquiss, Robert D. B. [Abstract] [Full Text]; Johnston, Michael R. [Abstract] [Full Text]; Jonasson, Rune [Abstract] [Full Text]; Jonsson, Hans [Abstract] [Full Text]
K: Kamiya, Tetsuro [Abstract] [Full Text]; Karg, Ortrud [Abstract] [Full Text]; Kawashima, Yasunaru [Abstract] [Full Text]; Kawashima, Yasunaru [Abstract] [Full Text]; Kawashima, Yasunaru [Abstract] [Full Text]; Keenan, Robert J. [Abstract] [Full Text]; Knoefel, Wolfram Trudo [Abstract] [Full Text]; Kodaira, Susumu [Full Text]; Kouchi, Yasuhiro [Abstract] [Full Text]; Kroshus, Timothy J. [Abstract] [Full Text]; Kshettry, Vibhu R. [Abstract] [Full Text]; Kumar, Naresh [Abstract] [Full Text]; Kuralay, Erkan [Full Text]; Kushwaha, Sudhir S. [Abstract] [Full Text]
L: Laks, Hillel [Abstract] [Full Text]; Landreneau, Rodney J. [Abstract] [Full Text]; Lang, Gregory [Abstract] [Full Text]; Lappas, Demetrios G. [Abstract] [Full Text]; Lappas, George D. [Abstract] [Full Text]; Lappas, Demetrios G. [Abstract] [Full Text]; Laufer, Gunther [Abstract] [Full Text]; Loop, Floyd D. [Abstract] [Full Text]
M: Martin-Duran, Rafael [Abstract] [Full Text]; Martzke, J. S. [Abstract] [Full Text]; Martzke, J. S. [Abstract] [Full Text]; Matsuki, Osamu [Abstract] [Full Text]; McGary, Suzan A. [Full Text]; McGee, D. Scott [Abstract] [Full Text]; McKneally, Martin F. [Full Text]; Michigan Ave, 401 N. [Full Text]; Mickle, Donald A. G. [Abstract] [Full Text]; Minchen, Rodney F. [Abstract] [Full Text]; Mitchell, Andrew G. [Abstract] [Full Text]; Miyauchi, Yoshimasa [Full Text]; Molina, J. Ernesto [Abstract] [Full Text]; Molina, Jorge R. [Abstract] [Full Text]; Mosca, Ralph S. [Full Text]; Murkin, J. M. [Abstract] [Full Text]; Murkin, J. M. [Abstract] [Full Text]
N: Navon, Gil [Abstract] [Full Text]; Neches, William H. [Abstract] [Full Text]; Nishigaki, Kyoichi [Abstract] [Full Text]
O: Obayashi, Hiroyuki [Full Text]; Ohno, N. [Abstract] [Full Text]; Okada, Kenji [Abstract] [Full Text]; Okada, Kenji [Full Text]; Okada, Masayoshi [Full Text]; Okada, Morihito [Full Text]; Onuki, Yoko [Abstract] [Full Text]
P: Palmarini, L. [Full Text]; Passlick, Bernward [Abstract] [Full Text]; Peek, Giles [Full Text]; Pezzuoli, Giuseppe [Full Text]; Phillips, Peter P. [Full Text]; Podczeck, Andrea [Abstract] [Full Text]; Pouleur, Hubert [Abstract] [Full Text]; President, [Full Text]; Pugh, Diane [Abstract] [Full Text]
R: Rebuffat, Carlo [Full Text]; Roviaro, Giancarlo [Full Text]; Rubeiz, G. J. [Abstract] [Full Text]; Rubin, Yoram [Abstract] [Full Text]
S: Sample, Madison [Abstract] [Full Text]; Sato, Hiroki [Abstract] [Full Text]; Sauvage, Lester R. [Abstract] [Full Text]; Scalambra, Silvio Marco [Full Text]; Schmidinger, Herwig [Abstract] [Full Text]; Schreiner, Wolfgang [Abstract] [Full Text]; Schuessler, Richard B. [Abstract] [Full Text]; Schuessler, Richard B. [Abstract] [Full Text]; Seah, Peng W. [Full Text]; Seki, Keiji [Full Text]; Sekine, Satoshi [Full Text]; Shi, Qun [Abstract] [Full Text]; Shibata, Yoshiki [Full Text]; Shinohara, Tokuko [Abstract] [Full Text]; Sibilla, E. [Full Text]; Skutelsky, Ehud [Abstract] [Full Text]; Smith, Audrey [Abstract] [Full Text]; Smith, Audrey [Abstract] [Full Text]; Sosnoski, Andrew [Full Text]; Spinale, Francis G. [Abstract] [Full Text]; Struber, Martin [Full Text]
T: Tadjkarimi, Samad [Abstract] [Full Text]; Takanami, Iwao [Full Text]; Tamiya, Kouichi [Abstract] [Full Text]; Tatar, Harun [Full Text]; Thetter, Olaf [Abstract] [Full Text]; TSFRE, [Full Text]
U: Uemura, Hideki [Abstract] [Full Text]; Uemura, Hideki [Abstract] [Full Text]; Uemura, Hideki [Abstract] [Full Text]; Utoh, Junichi [Full Text]
V: van Son, Jacques A. M. [Full Text]; Varoli, Federico [Full Text]; Vergani, Contardo [Full Text]; Vinten-Johansen, J. [Abstract] [Full Text]; Vitale, Nicola [Full Text]
W: Wada, H. [Abstract] [Full Text]; Walker, Jennifer D. [Abstract] [Full Text]; Wechsler, Andrew S. [Abstract] [Full Text]; Weisel, Richard D. [Abstract] [Full Text]; Wieselthaler, Georg [Abstract] [Full Text]; Williams, Mark W. [Abstract] [Full Text]; Wolfenden, Hugh [Full Text]; Wolner, Ernst [Abstract] [Full Text]; Wong, C. J. [Abstract] [Full Text]; Wong, C. J. [Abstract] [Full Text]; Wu, Moses Hong-De [Abstract] [Full Text]
Y: Yacoub, Magdi H. [Abstract] [Full Text]; Yagihara, Toshikatsu [Abstract] [Full Text]; Yagihara, Toshikatsu [Abstract] [Full Text]; Yagihara, Toshikatsu [Abstract] [Full Text]; Yamagishi, Itsuro [Full Text]; Yamamoto, Fumio [Abstract] [Full Text]; Yamamoto, Yasuki [Full Text]; Yamamoto, Tatsuya [Full Text]; Yamashita, Chojiro [Full Text]; Yokomise, H. [Abstract] [Full Text]; Yoshida, Hiroki [Abstract] [Full Text]
Z: Zhang, Ji [Abstract] [Full Text]; Zhao, Zhi-Qing [Abstract] [Full Text]
6: 60611, IL [Full Text]