JTCS -- Index by Author (Sep 1995; 110, Number 3)

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Index by Author: Sep 1995; 110 (3) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Abhyankar, A. D. [Full Text]; Andersson, Sture [Abstract] [Full Text]; Angelini, Gianni D. [Full Text]; Asoh, Hiroshi [Abstract] [Full Text]
B: Bezemer, P. Dick [Abstract] [Full Text]; Bhattacharya, Susmit [Full Text]; Bhuta, Sunita [Abstract] [Full Text]; Bierman, Morris I. [Abstract] [Full Text]; Black, Donald R. [Abstract] [Full Text]; Bogren, Hugo G. [Abstract] [Full Text]; Bolsin, Steve [Full Text]; Borker, Shirish [Full Text]; Branch, J. [Full Text]; Breivik, K. [Abstract] [Full Text]; Bruniaux, Jacqueline [Abstract] [Full Text]; Bryan, Alan J. [Full Text]; Buhr, J. [Full Text]; Bulder, Eisso R. [Abstract] [Full Text]; Bullough, David [Abstract] [Full Text]
C: Caes, Frank [Abstract] [Full Text]; Calliani, José [Full Text]; Camacho, Margarita T. [Abstract] [Full Text]; Carroll, Jo [Abstract] [Full Text]; Carson, Susan [Abstract] [Full Text]; Cartmill, T. B. [Abstract] [Full Text]; Chang, Paul [Abstract] [Full Text]; Chaukar, A. P. [Full Text]; Cheifetz, Ira M. [Abstract] [Full Text]; Clymer, Janice J. [Abstract] [Full Text]; Corno, Antonio [Full Text]; Cosgrove, Delos M. [Abstract] [Full Text]; Cosgrove, Delos M. [Abstract] [Full Text]; Craig, Damian M. [Abstract] [Full Text]
D: D'Amico, Thomas A. [Abstract] [Full Text]; Daily, William B. [Abstract] [Full Text]; Dandolu, B. Reddy [Full Text]; Das, B. [Full Text]; Davies, Peter S. W. [Abstract] [Full Text]; De Bacquer, Dirk [Abstract] [Full Text]; De Giacomo, Tiziano [Full Text]; de Jose Maria, B. [Full Text]; Delaere, Pierre R. [Abstract] [Full Text]; Deuvaert, Frank E. [Abstract] [Full Text]; Dregelid, E. [Abstract] [Full Text]; Drinkwater, Davis C. [Abstract] [Full Text]
E: Eijsman, Leon [Abstract] [Full Text]; Eijsman, León [Abstract] [Full Text]; Eishi, Kiyoyuki [Full Text]
F: Fabrizio, M. Charlene [Abstract] [Full Text]; Feenstra, Louw [Abstract] [Full Text]; Feng, William C. [Full Text]; Ferguson, Edward R. [Abstract] [Full Text]; Fernández, with the technical assistance of Montserrat [Abstract] [Full Text]; Firmin, David N. [Abstract] [Full Text]; Foster, Robert C. [Abstract] [Full Text]; François, Katrien [Abstract] [Full Text]
G: Galiñanes, Manuel [Abstract] [Full Text]; Gall, Ken [Abstract] [Full Text]; Gallandat Huet, Rolf C. G. [Abstract] [Full Text]; Glanville, A. [Full Text]; Glassman, Lawrence R. [Abstract] [Full Text]; Glynn, M. F. X. [Abstract] [Full Text]; Gomar, C. [Full Text]; Griffith, Bartley P. [Abstract] [Full Text]; Gutiérrez, J. Antonio [Abstract] [Full Text]
H: Hürtgen, M. [Full Text]; Harrison, G. [Full Text]; Hashimoto, Kazuhiro [Abstract] [Full Text]; Hausdorf, G. [Full Text]; Hayashida, Nobuhiko [Abstract] [Full Text]; Hearse, David J. [Abstract] [Full Text]; Heldal, K. [Abstract] [Full Text]; Hermans, Robert [Abstract] [Full Text]; Herndon, David N. [Abstract] [Full Text]; Herwig, V. [Full Text]; Hillman, Neal D. [Abstract] [Full Text]; Holman, William L. [Abstract] [Full Text]; Houyel, Lucile [Abstract] [Full Text]; Hurlé, Aquilino [Abstract] [Full Text]; Huybregts, Rien A. J. M. [Abstract] [Full Text]; Hvass, Ulrik [Full Text]
I: Ichinose, Yukito [Abstract] [Full Text]; Ikonomidis, John S. [Abstract] [Full Text]; Imamuma, Tetsuo [Full Text]; Inutsuka, Koji [Abstract] [Full Text]; Ishii, Shinichi [Abstract] [Full Text]; Isobe, Fumitaka [Full Text]; Ivanov, Joan [Abstract] [Full Text]; Iyer, K. S. [Full Text]; Izzat, Mohammad Bashar [Full Text]
J: Jamieson, Morgan P. G. [Abstract] [Full Text]; Jansen, Piet G. M. [Abstract] [Full Text]; Julliard, Jean Michel [Full Text]
K: Kadoba, Keishi [Abstract] [Full Text]; Kampmann, C. [Full Text]; Karski, Jacek M. [Abstract] [Full Text]; Katsuda, Yasaburo [Abstract] [Full Text]; Kaul, Ajay [Full Text]; Kawaguchi, Osamu [Abstract] [Full Text]; Kawahara, Katsunobu [Abstract] [Full Text]; Kawashima, Yasunaru [Full Text]; Keenan, Robert J. [Abstract] [Full Text]; Kelm, C. [Full Text]; Keogh, A. [Full Text]; Keon, W. J. [Abstract] [Full Text]; Kilner, Philip J. [Abstract] [Full Text]; Kirk, K. A. [Abstract] [Full Text]; Kitoh, Yoshitsugu [Full Text]; Kobayashi, Junjiro [Full Text]; Kodaira, Susumu [Full Text]; Konertz, W. [Full Text]; Korpela, Reijo [Abstract] [Full Text]; Kosakai, Yoshio [Full Text]; Koutlas, Theodore C. [Abstract] [Full Text]; Koyanagi, Katsuhito [Abstract] [Full Text]; Kramer, George C. [Abstract] [Full Text]; Kurosawa, Hiromi [Abstract] [Full Text]
L: Lacour-Gayet, Francois [Abstract] [Full Text]; Laks, Hillel [Abstract] [Full Text]; Lee, Jeong Ryul [Abstract] [Full Text]; Leijala, Mauri [Abstract] [Full Text]; Liu, Zi Ying [Abstract] [Full Text]; Loop, Floyd D. [Abstract] [Full Text]; Luciani, Giovanni B. [Full Text]; Lytle, Bruce W. [Abstract] [Full Text]
M: Macdonald, P. [Full Text]; Masters, R. G. [Abstract] [Full Text]; Mazorra, Francisco [Abstract] [Full Text]; McCammon, A. T. [Abstract] [Full Text]; McCarthy, Patrick M. [Abstract] [Full Text]; McCarthy, Patrick M. [Abstract] [Full Text]; McDaniel, Laura B. [Abstract] [Full Text]; Meliones, Jon N. [Abstract] [Full Text]; Mestres, C. [Full Text]; Meyers, Cary H. [Abstract] [Full Text]; Mickle, Donald A. G. [Abstract] [Full Text]; Miller, Dave P. [Abstract] [Full Text]; Mitchell, Ian M. [Abstract] [Full Text]; Mohabeer, Molly K. [Abstract] [Full Text]; Mohiaddin, Raad H. [Abstract] [Full Text]; Moral, V. [Full Text]; Muehrcke, Derek D. [Abstract] [Full Text]; Mullane, Kevin M. [Abstract] [Full Text]; Mundy, J. [Full Text]; Murrah, C. Patrick [Abstract] [Full Text]
N: Nagahori, Ryuichi [Abstract] [Full Text]; Nakanishi, Ryoichi [Abstract] [Full Text]; Nakano, Kiyoharu [Full Text]; Nataf, Isabelle [Full Text]; Nguyen, Thuan T. [Abstract] [Full Text]; Nielsen, V. G. [Abstract] [Full Text]; Nistal, J. Francisco [Abstract] [Full Text]; Norman, Peter [Abstract] [Full Text]; Nutt, Leta K. [Abstract] [Full Text]
O: O'Brien, Mark [Abstract] [Full Text]; Oates, R. K. [Abstract] [Full Text]; Ogella, David A. [Abstract] [Full Text]; Okabayashi, Kan [Abstract] [Full Text]
P: Pacifico, Albert D. [Abstract] [Full Text]; Pae, Walter E. [Abstract] [Full Text]; Parks, D. A. [Abstract] [Full Text]; Patwardhan, A. M. [Full Text]; Paulus, Reginald [Abstract] [Full Text]; Peltola, Kaija [Abstract] [Full Text]; Pesonen, Eero J. [Abstract] [Full Text]; Pessotto, Renzo [Abstract] [Full Text]; Peterseim, David S. [Abstract] [Full Text]; Petit, Jérôme [Abstract] [Full Text]; Pham, Si M. [Abstract] [Full Text]; Piedmonte, Marion R. [Abstract] [Full Text]; Pierce, William S. [Abstract] [Full Text]; Pipe, A. L. [Abstract] [Full Text]; Planché, Claude [Abstract] [Full Text]; Pollock, James C. S. [Abstract] [Full Text]; Praagh, Richard Van [Abstract] [Full Text]; Praagh, Stella Van [Abstract] [Full Text]; Primo, Georges [Abstract] [Full Text]
R: Raivio, Kari O. [Abstract] [Full Text]; Rendina, Erino A. [Full Text]; Resch, F. [Abstract] [Full Text]; Revuelta, José M. [Abstract] [Full Text]; Ricci, Costante [Full Text]; Rogers, P. [Full Text]; Rubino, Maurizio [Abstract] [Full Text]; Rudis, Ehud [Abstract] [Full Text]
S: Sabiston, David C. [Abstract] [Full Text]; Sairanen, Heikki [Abstract] [Full Text]; Sala, X. [Full Text]; Samuelson, P. N. [Abstract] [Full Text]; Sapirstein, John S. [Abstract] [Full Text]; Sasako, Yoshikado [Full Text]; Schneider, M. [Full Text]; Schwemmle, K. [Full Text]; Schwinn, Debra A. [Abstract] [Full Text]; Sciot, Raf [Abstract] [Full Text]; Serraf, Alain [Abstract] [Full Text]; Seshagiri, Stephanie [Abstract] [Full Text]; Shirai, Toshizumi [Abstract] [Full Text]; Shiraishi, Takeshi [Abstract] [Full Text]; Shirakusa, Takayuki [Abstract] [Full Text]; Simpson, J. M. [Abstract] [Full Text]; Singh, Arun K. [Full Text]; Slaats, Ed H. [Abstract] [Full Text]; Smith, Peter K. [Abstract] [Full Text]; Smith, Susan [Abstract] [Full Text]; Sonett, Josh R. [Abstract] [Full Text]; Sorribes, V. [Full Text]; Spratt, P. [Full Text]; Spruell, Russell D. [Abstract] [Full Text]; Stangeland, L. [Abstract] [Full Text]; Starnes, Vaughn A. [Full Text]; Stewart, Robert W. [Abstract] [Full Text]; Stewart, Robert W. [Abstract] [Full Text]; Sturk, Augueste [Abstract] [Full Text]; Svendsen, E. [Abstract] [Full Text]; Swilley, Sylvia [Full Text]
T: Tabuchi, Noriyuki [Abstract] [Full Text]; Taeymans, Yves [Abstract] [Full Text]; Takachi, Toshirou [Abstract] [Full Text]; Takamoto, Shinichi [Full Text]; Takanami, Iwao [Full Text]; Tan, S. [Abstract] [Full Text]; Tanaka, Kei [Abstract] [Full Text]; Tao, Weike [Abstract] [Full Text]; Tatsumura, Toshiki [Abstract] [Full Text]; Taylor, Paul C. [Abstract] [Full Text]; Teasdale, Sally J. [Abstract] [Full Text]; Tumiati, Laura C. [Abstract] [Full Text]; Turnbull, J. A. B. [Abstract] [Full Text]
V: Vahanian, Alex [Full Text]; Van Belleghem, Yves [Abstract] [Full Text]; van der Spoel, Hans I. [Abstract] [Full Text]; Van Nooten, Guido J. [Abstract] [Full Text]; Van Praagh, Richard [Abstract] [Full Text]; Van Trigt, Peter [Abstract] [Full Text]; VanKessel, Karl [Abstract] [Full Text]; Velthuis, Henk te [Abstract] [Full Text]; Venge, Per [Abstract] [Full Text]; Venugopal, P. [Full Text]; Venuta, Federico [Full Text]; Vertrees, Roger A. [Abstract] [Full Text]; Vicente, Walter V. A. [Abstract] [Full Text]; Vizza, Dario Carmine [Full Text]
W: Waldenberger, F. [Full Text]; Walley, V. M. [Abstract] [Full Text]; Watanabe, Sunao [Full Text]; Weisel, Richard D. [Abstract] [Full Text]; Wellens, Francis [Abstract] [Full Text]; Wildevuur, Charles R. H. [Abstract] [Full Text]; Wildevuur, Charles R. H. [Abstract] [Full Text]; Willmette, Christene [Abstract] [Full Text]; Wong, Mae [Abstract] [Full Text]; Wong, Peter [Abstract] [Full Text]
Y: Yamagishi, Masaaki [Abstract] [Full Text]; Yamamoto, Yasuki [Full Text]; Yamamoto, Tatsuya [Full Text]; Yang, Guang Z. [Abstract] [Full Text]; Yano, Tokujiro [Abstract] [Full Text]; Yokoyama, Hideki [Abstract] [Full Text]; Yoshino, Ichiro [Abstract] [Full Text]
Z: Zhai, Xiaolin [Abstract] [Full Text]; Ziv, Eli T. [Abstract] [Full Text]; Zwischenberger, Joseph B. [Abstract] [Full Text]