JTCS -- Index by Author (Mar 1996; 111, Number 3)

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Year:		Vol:		Page:

Index by Author: Mar 1996; 111 (3) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Ando, Hisami [Abstract] [Full Text]; Angrisani, Pasquale [Full Text]
B: Bains, Manjit S. [Abstract] [Full Text]; Baumann, F. Gregory [Abstract] [Full Text]; Berg, G. A. [Abstract] [Full Text]; Boineau, John P. [Abstract] [Full Text]; Bolger, Ann F. [Abstract] [Full Text]; Bosson, Catherine [Abstract] [Full Text]; Bremner, Cedric G. [Abstract] [Full Text]; Bromberg, Burt I. [Abstract] [Full Text]; Bruniaux, Jacqueline [Abstract] [Full Text]; Bruniaux, Jacqueline [Abstract] [Full Text]; Burdon, Thomas A. [Abstract] [Full Text]; Burt, Michael [Abstract] [Full Text]
C: Camporini, G. [Abstract] [Full Text]; Carrel, T. [Full Text]; Cavallo, Martyn J. [Abstract] [Full Text]; Ceithaml, Eric L. [Full Text]; Chandra, Mukul [Full Text]; Chekanov, Valeri [Full Text]; Colvin, Stephen B. [Abstract] [Full Text]; Cox, James L. [Abstract] [Full Text]; Cramp, G. [Abstract] [Full Text]
D: Dagge, Andreas [Abstract] [Full Text]; Daughters, George T. [Abstract] [Full Text]; de Leval, M. R. [Abstract] [Full Text]; DeMeester, Tom R. [Abstract] [Full Text]; Demontoux, Serge [Abstract] [Full Text]; Dewan, Naresh A. [Abstract] [Full Text]; Di Benedetto, Giuseppe [Full Text]; Dorman, B. Hugh [Abstract] [Full Text]; Dubini, G. [Abstract] [Full Text]; Duchateau, Jean [Abstract] [Full Text]
E: Eishi, Kiyoyuki [Abstract] [Full Text]
F: Faichney, A. [Abstract] [Full Text]; Faidutti, Bernard [Full Text]; Fishman, Noel H. [Full Text]; Fortner, Joseph G. [Abstract] [Full Text]; Friedli, Beat [Full Text]; Fuller, Clark B. [Abstract] [Full Text]
G: Galloway, Aubrey C. [Abstract] [Full Text]; Ginsberg, Robert J. [Abstract] [Full Text]; Glasson, Julie R. [Abstract] [Full Text]; Gobar, Lisa S. [Abstract] [Full Text]; Grossi, Eugene A. [Abstract] [Full Text]; Gu, Y. J. [Full Text]
H: Hagen, Jeffrey A. [Abstract] [Full Text]; Hanley, Frank L. [Abstract] [Full Text]; Hanley, Frank L. [Full Text]; Hinton, Robert B. [Abstract] [Full Text]; Houyel, Lucile [Abstract] [Full Text]; Huddleston, Charles B. [Abstract] [Full Text]; Huyzen, R. J. [Full Text]
I: Ichikawa, Hajime [Abstract] [Full Text]; Ingels, Neil B. [Abstract] [Full Text]; Isobe, Fumitaka [Abstract] [Full Text]; Ito, Takahiro [Abstract] [Full Text]
J: Jalali, H. [Abstract] [Full Text]
K: Kalangos, Afksendiyos [Full Text]; Kato, Junji [Abstract] [Full Text]; Kawashima, Yasunaru [Abstract] [Full Text]; Kawashima, Yasunaru [Abstract] [Full Text]; Kito, Yoshitsugu [Abstract] [Full Text]; Klein, Judith R. [Abstract] [Full Text]; Komeda, Masashi [Abstract] [Full Text]; Kosakai, Yoshio [Abstract] [Full Text]
L: Lacour-Gayet, François [Abstract] [Full Text]; Lecronier, Gilles [Abstract] [Full Text]; Liao, Kangxiong [Abstract] [Full Text]; Liddicoat, John R. [Abstract] [Full Text]; Little, Sponsor:Alex G. [Abstract] [Full Text]
M: Maalouf, Joseph [Abstract] [Full Text]; Marangi, Don [Full Text]; Marvin, William J. [Full Text]; Masiello, Paolo [Full Text]; Mastrogiovanni, Generoso [Full Text]; McCormack, Patricia M. [Abstract] [Full Text]; McLaren, D. [Abstract] [Full Text]; McLoughlin, David [Abstract] [Full Text]; Migliavacca, F. [Abstract] [Full Text]; Miller, D. Craig [Abstract] [Full Text]; Mitchell, R. Scott [Abstract] [Full Text]; Mokhfi, Emir [Abstract] [Full Text]; Morrison, J. [Abstract] [Full Text]; Mouroux, Jérôme [Abstract] [Full Text]
N: Nagata, Seiki [Abstract] [Full Text]; Nakamura, Tomohiro [Abstract] [Full Text]; Nakano, Kiyoharu [Abstract] [Full Text]; Nerlich, Andreas [Abstract] [Full Text]; Niczyporuk, Marek A. [Abstract] [Full Text]; Nikolaychik, Victor [Full Text]
O: Ohashi, Takeki [Abstract] [Full Text]
P: Padovani, Bernard [Abstract] [Full Text]; Pathi, V. [Abstract] [Full Text]; Peters, William S. [Abstract] [Full Text]; Peters, Jeffrey H. [Abstract] [Full Text]; Peters, William S. [Abstract] [Full Text]; Peterson, Richard J. [Full Text]; Pietrabissa, R. [Abstract] [Full Text]; Piot, Dominique [Abstract] [Full Text]; Planché, Claude [Abstract] [Full Text]; Planché, Claude [Abstract] [Full Text]; Pommier, Rodney [Abstract] [Full Text]; Pompili, Mario F. [Abstract] [Full Text]; Prétre, René [Full Text]
R: Reddy, V. Mohan [Abstract] [Full Text]; Redington, A. [Abstract] [Full Text]; Reichart, Bruno [Abstract] [Full Text]; Reitz, Bruce A. [Abstract] [Full Text]; Ribakove, Greg H. [Abstract] [Full Text]; Ribakove, Greg H. [Abstract] [Full Text]; Richelme, Henri [Abstract] [Full Text]; Ritter, Manfred [Abstract] [Full Text]; Robbins, Robert C. [Abstract] [Full Text]; Rodefeld, Mark D. [Abstract] [Full Text]; Rotomondo, Christine [Abstract] [Full Text]; Rouge, Jean-Claude [Full Text]; Roy, Raymond C. [Abstract] [Full Text]; Russo, Rosa [Full Text]
S: Sasako, Yoshikado [Abstract] [Full Text]; Schuessler, Richard B. [Abstract] [Full Text]; Schwartz, Daniel S. [Abstract] [Full Text]; Scott, Andrew [Abstract] [Full Text]; Scott, Walter J. [Abstract] [Full Text]; Seghaye, Marie-Christine [Abstract] [Full Text]; Seo, Takahiko [Abstract] [Full Text]; Serraf, Alain [Abstract] [Full Text]; Serraf, Alain [Abstract] [Full Text]; Shibata, Toshihiko [Abstract] [Full Text]; Siegel, Lawrence C. [Abstract] [Full Text]; Siegel, Lawrence C. [Abstract] [Full Text]; Sousa-Uva, Miguel [Abstract] [Full Text]; Spinale, Francis G. [Abstract] [Full Text]; Splittgerber, Fred H. [Full Text]; St. Goar, Frederick G. [Abstract] [Full Text]; St. Goar, Frederick G. [Abstract] [Full Text]; Stevens, John H. [Abstract] [Full Text]; Stevens, John H. [Abstract] [Full Text]; Stinson, Edward B. [Abstract] [Full Text]; Strenkert, Christine [Abstract] [Full Text]; Sunderland, John J. [Abstract] [Full Text]
T: Takagi, Hiroyuki [Abstract] [Full Text]; Tchekanov, Guennady [Full Text]; Terry, John D. [Abstract] [Full Text]; Touchot, Anita [Abstract] [Full Text]; Turnbull, Allan D. [Abstract] [Full Text]
U: Ueda, Hatsue [Abstract] [Full Text]
V: van Oeveren, W. [Full Text]; van Son, Jacques A. M. [Full Text]; Vetter, Herbert [Abstract] [Full Text]; Vierra, Mark A. [Abstract] [Full Text]
W: Wampler, Richard K. [Abstract] [Full Text]; Welsch, Ulrich [Abstract] [Full Text]; Williard, William C. [Abstract] [Full Text]; Wolfhard, Ulrich [Full Text]
Y: Yamamoto, Fumio [Abstract] [Full Text]; Yamamoto, Hiroshi [Abstract] [Full Text]; Yeh, Samuel [Abstract] [Full Text]