JTCS -- Index by Author (Aug 1996; 112, Number 2)

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Year:		Vol:		Page:

Index by Author: Aug 1996; 112 (2) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Alivizatos, Peter [Full Text]; Alsoufiev, Alexander [Full Text]; Alvarez, J. M. [Abstract] [Full Text]; Alwan, Kifah [Abstract] [Full Text]; Amsel, Bram J. [Full Text]; Aoe, Motoi [Abstract] [Full Text]; Apperson-Hansen, Carolyn [Abstract] [Full Text]; Ariyasu, Tetsuya [Abstract] [Full Text]; Ashour, M. [Abstract] [Full Text]; Ashwal, Stephen [Abstract] [Full Text]; Asou, Toshihide [Abstract] [Full Text]; Atari, Carlo [Abstract] [Full Text]; Atkinson, S. J. [Abstract] [Full Text]
B: Bailey, Leonard [Abstract] [Full Text]; Barak, Yaakov [Abstract] [Full Text]; Berggren, Håkan [Abstract] [Full Text]; Bhattacharya, K. [Abstract] [Full Text]; Blaive, Bruno [Abstract] [Full Text]; Bogers, Ad [Abstract] [Full Text]; Bogousslavsky, J. [Abstract] [Full Text]; Boley, Theresa [Abstract] [Full Text]; Boonstra, P. W. [Abstract] [Full Text]; Booth, J. V. [Full Text]; Borsh, Judith A. [Abstract] [Full Text]; Bos, Egbert [Abstract] [Full Text]; Brennan, P. [Abstract] [Full Text]; Bruniaux, J. [Abstract] [Full Text]
C: Capehart, John [Full Text]; Cendón, Antonio Amaro [Abstract] [Full Text]; Chavaillon, Jean-Michel [Abstract] [Full Text]; Chocron, Sidney [Abstract] [Full Text]; Choong, C. [Abstract] [Full Text]; Clement, François [Abstract] [Full Text]; Cohn, William E. [Abstract] [Full Text]; Cooper, Joel D. [Abstract] [Full Text]; Cosgrove, Delos M. [Abstract] [Full Text]; Cosgrove, Delos M. [Abstract] [Full Text]; Craver, Joseph M. [Abstract] [Full Text]
D: Dartevelle, Philippe G. [Full Text]; de la Peña, Miguel Gil [Abstract] [Full Text]; De Montpreville, Vincent [Abstract] [Full Text]; Deal, C. W. [Abstract] [Full Text]; DeMeester, Steve R. [Abstract] [Full Text]; DeSmet, Jean-Marie [Full Text]; Despotis, George J. [Full Text]; deVries, A. J. [Abstract] [Full Text]; Devuyst, G. [Abstract] [Full Text]; DiSesa, Verdi J. [Abstract] [Full Text]; Dromer, Christian [Abstract] [Full Text]; Dulmet, Elisabeth [Abstract] [Full Text]
E: Edmunds, L. Henry [Full Text]; Eijsman, Leon [Abstract] [Full Text]; Eisenberg, R. [Abstract] [Full Text]; Elkaïm, Dan [Abstract] [Full Text]; Erez, Eldad [Abstract] [Full Text]; Eriksson, Bengt [Abstract] [Full Text]; Etievent, Joseph-Philippe [Abstract] [Full Text]
F: Feins, Richard [Abstract] [Full Text]; Fernandez, Marino Vega [Abstract] [Full Text]; Fineman, Jeffrey R. [Abstract] [Full Text]; Flameng, Willem [Abstract] [Full Text]; Franco-Cereceda, Anders [Abstract] [Full Text]; French, Bruce G. [Abstract] [Full Text]; Fuentes, Victor Castelo [Abstract] [Full Text]; Fukuda, Mikihisa [Abstract] [Full Text]; Fukuse, Tatsuo [Abstract] [Full Text]; Fukushima, N. [Full Text]
G: Ganjoo, Anoop K. [Full Text]; Garcá-Acuña, José María [Abstract] [Full Text]; García-Bengoechea, José Benito [Abstract] [Full Text]; Gil-Ad, Irit [Abstract] [Full Text]; Gilljam, Tomas [Abstract] [Full Text]; Gitter, Richard [Full Text]; Goldman, Allan P. [Full Text]; González-Juanatey, José Ramón [Abstract] [Full Text]; Goodnough, Lawrence T. [Full Text]; Gordon, Robert T. [Full Text]; Gorman, Robert C. [Full Text]; Gorman, Joseph H. [Full Text]; Gornbein, Jeffrey A. [Abstract] [Full Text]; Gott, John Parker [Abstract] [Full Text]; Gu, Y. J. [Abstract] [Full Text]; Guffi, M. [Abstract] [Full Text]; Guyton, Robert A. [Abstract] [Full Text]
H: Hanley, Frank L. [Abstract] [Full Text]; Hara, Hiroshi [Abstract] [Full Text]; Harasaki, Hiroaki [Abstract] [Full Text]; Hasdai, David [Abstract] [Full Text]; Haworth, S. G. [Full Text]; Hazelrigg, Stephen [Abstract] [Full Text]; Henkle, Joseph [Abstract] [Full Text]; Henson, Martha B. [Abstract] [Full Text]; Hinshaw, David B. [Abstract] [Full Text]; Hitomi, Shigeki [Abstract] [Full Text]; Hitomi, S. [Abstract] [Full Text]; Hoekstra, Franciska [Abstract] [Full Text]; Holm, Peter [Abstract] [Full Text]; Holmes, E. Carmack [Abstract] [Full Text]; Holmgren, Daniel [Abstract] [Full Text]; Holshouser, Barbara A. [Abstract] [Full Text]; Hunt, Kelly K. [Abstract] [Full Text]
I: Ichinari, Hideki [Abstract] [Full Text]; Ike, Osamu [Abstract] [Full Text]; Inui, K. [Abstract] [Full Text]; Inui, Kenji [Abstract] [Full Text]; Ishiguro, Kiyosuke [Abstract] [Full Text]; Ishii, Noboru [Abstract] [Full Text]; Isizaka, Tooru [Abstract] [Full Text]; Itoh, H. [Abstract] [Full Text]
J: Jain, Dharam P. [Full Text]; Jeanrenaud, X. [Abstract] [Full Text]; Jett, G. Kimble [Full Text]; Johnson, Frank E. [Abstract] [Full Text]; Johnson, W. Dudley [Full Text]; Johnson, Robert G. [Abstract] [Full Text]; Johnstone, David [Abstract] [Full Text]; Joist, Heinrich [Full Text]; Jones, Ellis L. [Abstract] [Full Text]; Jutte, Nicolet [Abstract] [Full Text]
K: Kamiya, Tetsuro [Abstract] [Full Text]; Kantelip, Jean-Pierre [Abstract] [Full Text]; Kantelip, Bernadette [Abstract] [Full Text]; Kawashima, Yasunaru [Abstract] [Full Text]; Kawasuji, Michio [Abstract] [Full Text]; Keenan, Robert [Abstract] [Full Text]; Keller, Cesar [Abstract] [Full Text]; Kern, John A. [Abstract] [Full Text]; Khoury, Wassim [Abstract] [Full Text]; Kim, Yong-In [Abstract] [Full Text]; Kissling, Mary Ellen [Abstract] [Full Text]; Klein, Judith R. [Abstract] [Full Text]; Knoop, Christiaan [Abstract] [Full Text]; Koga, Yasunori [Abstract] [Full Text]; Kondoh, Keiichiro [Full Text]; Kottke-Marchant, Kandice [Abstract] [Full Text]; Kron, Irving L. [Abstract] [Full Text]
L: Lacour-Gayet, F. [Abstract] [Full Text]; Landreneau, Rodney [Abstract] [Full Text]; Lang, Gordon E. [Full Text]; Lang-Lazdunski, Loïc [Abstract] [Full Text]; Lawyer, Carl [Abstract] [Full Text]; Laycock, Sarra [Abstract] [Full Text]; Leca, Francine [Abstract] [Full Text]; LeClerc, Jean-Louis [Full Text]; Levasseur, Philippe [Abstract] [Full Text]; Levi, Jean-François [Abstract] [Full Text]; Levine, Vladimir [Full Text]; Levy, Paul [Abstract] [Full Text]; Liddicoat, John R. [Abstract] [Full Text]; Lin, John C. [Abstract] [Full Text]; Loop, Floyd D. [Abstract] [Full Text]; Loveridge, K. [Abstract] [Full Text]; Lowe, Roger A. [Abstract] [Full Text]; Lytle, Bruce W. [Abstract] [Full Text]
M: Macchiarini, Paolo [Full Text]; Macrae, D. J. [Full Text]; Magdeleinat, Pierre [Abstract] [Full Text]; Magee, Mitchell [Abstract] [Full Text]; Magotra, Ratna A. [Full Text]; Martin, Tomas D. [Abstract] [Full Text]; Matsuda, H. [Full Text]; Matsuda, Hitoshi [Abstract] [Full Text]; Matsuki, Osamu [Abstract] [Full Text]; Matsuura, Yuichiro [Full Text]; Matsuzaki, Yasunori [Abstract] [Full Text]; Mauney, Michael C. [Abstract] [Full Text]; McBride, W. T. [Full Text]; McCarthy, Patrick M. [Abstract] [Full Text]; McCarthy, Patrick M. [Abstract] [Full Text]; McElhinney, Doff B. [Abstract] [Full Text]; McFadden, David W. [Abstract] [Full Text]; McKirgan, Lowell W. [Abstract] [Full Text]; Mearns, Alan J. [Abstract] [Full Text]; Mehta, Sanjay M. [Full Text]; Meyns, Bart [Abstract] [Full Text]; Minohara, Seiichiro [Full Text]; Mitsui, Norimasa [Full Text]; Mizuno, Hiroshi [Abstract] [Full Text]; Mohiuddin, Muhammad [Abstract] [Full Text]; Mora, Christina T. [Abstract] [Full Text]; Mori, Tohru [Abstract] [Full Text]; Morita, Shigeki [Abstract] [Full Text]; Moulijn, Adrian C. [Full Text]; Mouroux, Jérôme [Abstract] [Full Text]; Muehrcke, Derek D. [Abstract] [Full Text]; Murkin, John M. [Abstract] [Full Text]; Myx, Aline [Abstract] [Full Text]
N: Nagata, Hideyuki [Full Text]; Nakamura, Hiroshige [Abstract] [Full Text]; Nakano, S. [Full Text]; Naunheim, Keith [Abstract] [Full Text]; Naunheim, Keith S. [Abstract] [Full Text]; Nazari, Stefano [Full Text]; Nishigaki, Kyoichi [Abstract] [Full Text]; Nunn, G. R. [Full Text]
O: O'Brien, Mark F. [Abstract] [Full Text]; Oe, Masahiro [Abstract] [Full Text]; Ogella, David A. [Abstract] [Full Text]; Okabayashi, Kan [Abstract] [Full Text]; Okada, Kenji [Abstract] [Full Text]; Okada, Masayoshi [Abstract] [Full Text]; Okada, Morihito [Abstract] [Full Text]
P: Padovani, Bernard [Abstract] [Full Text]; Pae, Walter E. [Full Text]; Pasque, Michael [Full Text]; Patterson, G. Alexander [Abstract] [Full Text]; Paul, Elizabeth A. [Abstract] [Full Text]; Perrin, Christophe [Abstract] [Full Text]; Pierre-Yared, Jean [Abstract] [Full Text]; Planché, C. [Abstract] [Full Text]
R: Raanani, Ehud [Abstract] [Full Text]; Ramsay, Michael [Full Text]; Reddy, V. Mohan [Abstract] [Full Text]; Regnard, Jean-François [Abstract] [Full Text]; Richelme, Henri [Abstract] [Full Text]; Robotin, M. C. [Abstract] [Full Text]; Rotomondo, Christine [Abstract] [Full Text]; Roussin, R. [Abstract] [Full Text]; Rubin, Joseph [Full Text]; Ruggiero, Vincent [Abstract] [Full Text]
S: Südow, Göran [Abstract] [Full Text]; Sabanathan, Sabaratnam [Abstract] [Full Text]; Sadeghi, H. [Abstract] [Full Text]; Sakakibara, Naoki [Abstract] [Full Text]; Sasaki, Shinjiro [Full Text]; Sawada, Yoshihide [Full Text]; Scannell, J. Gordon [Full Text]; Schell, Randall M. [Abstract] [Full Text]; Schmit, Donald B. [Abstract] [Full Text]; Sciurba, Frank [Abstract] [Full Text]; Sclarovsky, Samuel [Abstract] [Full Text]; Sellke, Frank W. [Abstract] [Full Text]; Selman, Raphael [Abstract] [Full Text]; Serraf, A. [Abstract] [Full Text]; Shah, Rajesh [Abstract] [Full Text]; Shahani, Rohit [Full Text]; Shankar, Vijaya S. [Full Text]; Shen, Zhenya [Abstract] [Full Text]; Sherwood, M. C. [Full Text]; Shibata, Koichiro [Abstract] [Full Text]; Shikata, Hiroo [Full Text]; Shimizu, Tetsuya [Abstract] [Full Text]; Shirakura, R. [Full Text]; Shoemaker, Kanili [Full Text]; Sholler, G. F. [Full Text]; Smedira, Nicholas G. [Abstract] [Full Text]; Smith, Susan [Abstract] [Full Text]; Solymar, Laszlo [Abstract] [Full Text]; Speekenbrink, Ron G. H. [Abstract] [Full Text]; Stamler, Alon [Abstract] [Full Text]; Stewart, Robert W. [Abstract] [Full Text]; Sturk, Augueste [Abstract] [Full Text]; Sueda, Taijiro [Full Text]; Sugimoto, Takaki [Abstract] [Full Text]; Sulkes, Jaqueline [Abstract] [Full Text]; Suzuki, Yoshimasa [Abstract] [Full Text]; Swisher, Stephen G. [Abstract] [Full Text]
T: Tackett, Randall [Full Text]; Taenaka, N. [Full Text]; Taggart, David P. [Abstract] [Full Text]; Tajima, Sadao [Full Text]; Takahashi, Osahiro [Abstract] [Full Text]; Takemura, Hirofumi [Abstract] [Full Text]; Tanaka, Yoshio [Full Text]; Tanaka, Yoshiyuki [Abstract] [Full Text]; Tanaka, Fumihiro [Abstract] [Full Text]; Taniguchi, Yuji [Abstract] [Full Text]; Tatsumi, Takahiko O. [Full Text]; Taylor, Paul C. [Abstract] [Full Text]; Tedoriya, Takeo [Abstract] [Full Text]; Thibert, Michèle [Abstract] [Full Text]; Tokunaga, Kouichi [Abstract] [Full Text]; Toubin, Gerard [Abstract] [Full Text]; Triantafillou, Anastasios N. [Abstract] [Full Text]; Tribble, Curtis G. [Abstract] [Full Text]; Tsuchida, Takao [Full Text]
U: Ueda, M. [Abstract] [Full Text]; Uemura, Hideki [Abstract] [Full Text]; Ushijima, Teruaki [Abstract] [Full Text]; Uva, M. Sousa [Abstract] [Full Text]
V: Vaessen, Len [Abstract] [Full Text]; van Oeveren, W. [Abstract] [Full Text]; Vernant, Françoise [Abstract] [Full Text]; Vidne, Bernardo A. [Abstract] [Full Text]; Vincent, Jean-Louis [Full Text]; Virgo, Katherine S. [Abstract] [Full Text]
W: Wada, H. [Abstract] [Full Text]; Wada, Hiromi [Abstract] [Full Text]; Waldenberger, Ferdinand [Abstract] [Full Text]; Wan, Song [Full Text]; Wang, Steven Y. [Abstract] [Full Text]; Ward, M. [Abstract] [Full Text]; Wassenaar, Claas [Abstract] [Full Text]; Watanabe, Yoh [Abstract] [Full Text]; Weimar, Willem [Abstract] [Full Text]; Weintraub, William S. [Abstract] [Full Text]; Weintraub, William S. [Abstract] [Full Text]; Weintraub, Ronald M. [Abstract] [Full Text]; Wildevuur, Charles R. H. [Abstract] [Full Text]; Wilson, Kathy [Abstract] [Full Text]; Wong, Poosing [Abstract] [Full Text]; Wong, Mae [Abstract] [Full Text]; Wright, John E. [Abstract] [Full Text]
Y: Yagihara, Toshikatsu [Abstract] [Full Text]; Yamagishi, Hiroyuki [Abstract] [Full Text]; Yamamoto, Fumio [Abstract] [Full Text]; Yamashita, Teruo [Abstract] [Full Text]; Yamashita, Chojiro [Abstract] [Full Text]; Yamashita, Motohiro [Abstract] [Full Text]; Yanagihara, Kazuhiro [Abstract] [Full Text]; Yasui, Hisataka [Abstract] [Full Text]; Yokomise, Hiroyasu [Abstract] [Full Text]; Yokomise, H. [Abstract] [Full Text]; Yoshioka, Makoto [Abstract] [Full Text]
Z: Zinner, Michael J. [Abstract] [Full Text]; Zumbro, G. Lionel [Full Text]