JTCS -- Index by Author (Oct 1996; 112, Number 4)

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	Author:		Keyword(s):
Year:		Vol:		Page:

Index by Author: Oct 1996; 112 (4) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Acar, Christophe [Abstract] [Full Text]; Akins, Cary W. [Abstract] [Full Text]; Angelini, Gianni D. [Abstract] [Full Text]; Asamura, Hisao [Abstract] [Full Text]; Ashton, Robert C. [Abstract] [Full Text]
B: Bales, Amy [Abstract] [Full Text]; Bashar Izzat, Mohammad [Abstract] [Full Text]; Bavaria, Joseph E. [Abstract] [Full Text]; Bernal, José M. [Abstract] [Full Text]; Beyssen, Bernard [Abstract] [Full Text]; Bingisser, Roland [Abstract] [Full Text]; Birdi, Inderpaul [Abstract] [Full Text]; Biron, Pierre [Full Text]; Black, Andrew M. S. [Abstract] [Full Text]; Blackstone, Eugene H. [Abstract] [Full Text]; Bloch, Konrad E. [Abstract] [Full Text]; Boineau, John P. [Abstract] [Full Text]; Boineau, John P. [Abstract] [Full Text]; Bonney, Sharon L. [Abstract] [Full Text]; Boonstra, Piet W. [Abstract] [Full Text]; Brizard, Christian [Abstract] [Full Text]; Bromberg, Burt I. [Abstract] [Full Text]; Bromberg, Burt I. [Abstract] [Full Text]; Bromberg, Burt I. [Abstract] [Full Text]; Bryan, Alan J. [Abstract] [Full Text]; Burkhoff, Daniel [Abstract] [Full Text]
C: Campbell, Colin [Full Text]; Cardinal, René [Abstract] [Full Text]; Carpentier, Alain [Abstract] [Full Text]; Cavallo, Martyn J. [Abstract] [Full Text]; Chastre, Jean [Abstract] [Full Text]; Cheung, Albert T. [Abstract] [Full Text]; Clozel, Martine [Abstract] [Full Text]; Cohn, Lawrence H. [Abstract] [Full Text]; Cosgrove, Delos M. [Abstract] [Full Text]; Cox, James L. [Abstract] [Full Text]; Cox, James L. [Abstract] [Full Text]; Crawford, Fred A. [Abstract] [Full Text]
D: D'Alessandro, David [Abstract] [Full Text]; D'Ambra, Michael N. [Abstract] [Full Text]; Day, Christopher J. E. [Abstract] [Full Text]; De Giacomo, Tiziano [Full Text]; Deiraniya, Abdul [Full Text]; Deslauriers, Roxanne [Abstract] [Full Text]; Dorman, B. Hugh [Abstract] [Full Text]; Droz, Jean Pierre [Full Text]
E: Ebels, Tjark [Abstract] [Full Text]; Eckel, Hans-Edmund [Abstract] [Full Text]; Ede, Mauricio [Abstract] [Full Text]
F: Fagon, Jean-Yves [Abstract] [Full Text]; Falk, Volkmar [Full Text]; Farge, Arnaud [Abstract] [Full Text]; Ferguson, Edward R. [Abstract] [Full Text]; Filgueiras, Carlos L. [Abstract] [Full Text]; Flaishman, Isacco [Full Text]; Franco-Cereceda, Anders [Abstract] [Full Text]; Fuller, B. J. [Abstract] [Full Text]; Furrer, M. [Full Text]
G: Gamel, Ahmed El [Full Text]; Gandhi, Sanjiv K. [Abstract] [Full Text]; Gandhi, Sanjiv K. [Abstract] [Full Text]; Gandhi, Sanjiv K. [Abstract] [Full Text]; Gardner, Freda [Abstract] [Full Text]; Gardner, Timothy J. [Abstract] [Full Text]; Gaux, Jean-Claude [Abstract] [Full Text]; Giacomini, Matteo [Full Text]; Giaid, A. [Abstract] [Full Text]; Gibert, Claude [Abstract] [Full Text]; Goldstein, Daniel J. [Abstract] [Full Text]; Grandjean, Jan G. [Abstract] [Full Text]; Green, C. J. [Abstract] [Full Text]; Griffin, John H. [Abstract] [Full Text]; Griffith, Bartley P. [Full Text]; Gybels, Iwan [Full Text]
H: Handy, John R. [Abstract] [Full Text]; Hauser, Markus [Abstract] [Full Text]; Heyer, Peter den [Abstract] [Full Text]; Hidalgo, M. A. [Abstract] [Full Text]; Hinton, Robert B. [Abstract] [Full Text]; Hisahara, Manabu [Abstract] [Full Text]; Hofmann, Hans-Stefan [Full Text]; Holm, Peter [Abstract] [Full Text]; Holman, William L. [Abstract] [Full Text]; Hopf, M. [Full Text]; Hori, Goichi [Full Text]; Huddleston, Charles B. [Abstract] [Full Text]; Huddleston, Charles B. [Abstract] [Full Text]; Huddleston, Charles B. [Abstract] [Full Text]
I: Inoue, Kanji [Full Text]; Itescu, Silviu [Abstract] [Full Text]; Iwase, Tomoyuki [Full Text]
J: Jamjoum, A. [Abstract] [Full Text]; Johnson, Patricia I. [Abstract] [Full Text]
K: Kaemmerlen, Pierre [Full Text]; Kamio, Yoshito [Full Text]; Karp, Robert [Abstract] [Full Text]; Katsuyama, Kazuhiko [Full Text]; Kaur, Shubjeet [Abstract] [Full Text]; Kawachi, Yoshito [Abstract] [Full Text]; Kawamura, Yuichiro [Abstract] [Full Text]; Kazui, Terushisa [Abstract] [Full Text]; Keevil, Brian [Full Text]; Knolle, Jürgen [Full Text]; Kolobow, Theodor [Full Text]; Komatsu, Sakuzo [Abstract] [Full Text]; Kondo, Haruhiko [Abstract] [Full Text]; Kormos, Robert L. [Full Text]; Kozlowski, Piotr [Abstract] [Full Text]; Kwiatkowski, Pawel A. [Abstract] [Full Text]
L: Lancey, Robert A. [Abstract] [Full Text]; Lang, Roberto M. [Abstract] [Full Text]; Lassau, Jean-Pierre [Abstract] [Full Text]; Lee, Robert E. [Abstract] [Full Text]; Lemole, Gerald M. [Abstract] [Full Text]; Leone, Lisa [Abstract] [Full Text]; Levin, Howard [Abstract] [Full Text]; Levy, Jerrold H. [Abstract] [Full Text]; Li, Jian-Ming [Abstract] [Full Text]; Liska, Jan [Abstract] [Full Text]; Liu, Z. [Abstract] [Full Text]; Llorca, Javier [Abstract] [Full Text]; Lonchyna, Vassyl A. [Abstract] [Full Text]; Lopatatzidis, Athanasios [Abstract] [Full Text]; Lundström, Ulla [Abstract] [Full Text]; Lynch, Karen E. [Abstract] [Full Text]
M: Müller, Rolf-Peter [Abstract] [Full Text]; Maddi, Rosemarie [Abstract] [Full Text]; Mallory, George B. [Abstract] [Full Text]; Marttinen, Eino [Abstract] [Full Text]; Masuda, Munetaka [Abstract] [Full Text]; Michel, Olaf [Abstract] [Full Text]; Michelson, Alan D. [Abstract] [Full Text]; Michler, Robert E. [Abstract] [Full Text]; Mohr, Friedrich W. [Full Text]; Montoya, Alvaro [Abstract] [Full Text]; Mori, Atsumi [Full Text]; Morita, Shigeki [Abstract] [Full Text]; Mousseaux, Elie [Abstract] [Full Text]; Murrah, C. Patrick [Abstract] [Full Text]
N: Nadeau, Réginald [Abstract] [Full Text]; Nakajima, Yasuhiko [Full Text]; Nakayama, Haruhiko [Abstract] [Full Text]; Naruke, Tsuguo [Abstract] [Full Text]
O: O'Hair, Daniel P. [Abstract] [Full Text]; Ochiai, Yoshie [Abstract] [Full Text]; Okike, Okike N. [Abstract] [Full Text]; Okumura, Shinji [Abstract] [Full Text]; Orfei, Emilo [Abstract] [Full Text]; Oz, Mehmet C. [Abstract] [Full Text]; Oz, Mehmet [Abstract] [Full Text]
P: Pagé, Pierre L. [Abstract] [Full Text]; Patterson, Terry [Abstract] [Full Text]; Petäjä, Jari [Abstract] [Full Text]; Pezzella, A. Thomas [Abstract] [Full Text]; Pham, Si M. [Full Text]; Platt, Jeffrey L. [Abstract] [Full Text]; Portoghese, Michele [Abstract] [Full Text]
R: Rabasa, José M. [Abstract] [Full Text]; Ramsheyi, Amhad [Abstract] [Full Text]; Reali-Forster, Chiara [Full Text]; Rebollo, M. Henar [Abstract] [Full Text]; Regragui, Idriss [Abstract] [Full Text]; Reis, A. [Abstract] [Full Text]; Rendina, Erino Angelo [Full Text]; Revuelta, José M. [Abstract] [Full Text]; Ricci, Costante [Full Text]; Richards, Rafael M. [Abstract] [Full Text]; Ris, H. B. [Full Text]; Rivoire, Michel [Full Text]; Rodefeld, Mark D. [Abstract] [Full Text]; Rose, Eric A. [Abstract] [Full Text]; Rose, Eric [Abstract] [Full Text]; Rosskothen, Heinz D. [Abstract] [Full Text]; Roy, Raymond C. [Abstract] [Full Text]; Russi, Erich W. [Abstract] [Full Text]; Ryner, Lawrence [Abstract] [Full Text]
S: Sairanen, Heikki [Abstract] [Full Text]; Salerno, Tomas A. [Abstract] [Full Text]; Sato, Mitsuru [Full Text]; Saunders, John K. [Abstract] [Full Text]; Savard, Pierre [Abstract] [Full Text]; Savino, Joseph S. [Abstract] [Full Text]; Scheimberg, Andres [Abstract] [Full Text]; Schmidt, Ann Marie [Abstract] [Full Text]; Schuessler, Richard B. [Abstract] [Full Text]; Schuessler, Richard B. [Abstract] [Full Text]; Seghaye, Marie-Christine [Full Text]; Serrick, C. J. [Abstract] [Full Text]; Shah, K. A. [Abstract] [Full Text]; Shah, Aamir S. [Abstract] [Full Text]; Shennib, H. [Abstract] [Full Text]; Sievers, Hans H. [Full Text]; Singh, Sanjay [Abstract] [Full Text]; Spanier, Talia [Abstract] [Full Text]; Spinale, Francis G. [Abstract] [Full Text]; Spruell, Russell D. [Abstract] [Full Text]; Stahl, Russell F. [Abstract] [Full Text]; Stamatis, Kathy [Abstract] [Full Text]; Stecker, Mark M. [Abstract] [Full Text]; Stern, David [Abstract] [Full Text]; Suciu-Foca, Nicole [Abstract] [Full Text]; Sugita, Takaaki [Full Text]; Sullivan, Henry J. [Abstract] [Full Text]; Summers, Randy [Abstract] [Full Text]; Sun, Jiankang [Abstract] [Full Text]; Suzuki, Takashi [Full Text]; Suzuki, Shuichi [Full Text]
T: Tamaki, Shunichi [Full Text]; Tamiya, Yukihiko [Abstract] [Full Text]; Tanaka, Terumitsu [Full Text]; Tanaka, Toshiaki [Abstract] [Full Text]; Tanoue, Yoshihisa [Abstract] [Full Text]; Tominaga, Ryuji [Abstract] [Full Text]; Tran, Hoang [Abstract] [Full Text]; Treilleux, Isabelle [Full Text]; Trouillet, Jean-Louis [Abstract] [Full Text]; Tsuboi, Masahiro [Abstract] [Full Text]; Tsuchiya, Ryosuke [Abstract] [Full Text]; Tugulea, Sorina [Abstract] [Full Text]; Turken, Bryan J. [Abstract] [Full Text]
V: Valeri, C. Robert [Abstract] [Full Text]; Van Praagh, Richard [Full Text]; van Son, Jacques A. M. [Full Text]; Vander Salm, Thomas J. [Abstract] [Full Text]; Venuta, Federico [Full Text]; Vicente, Walter V. A. [Abstract] [Full Text]; Vignon, Philippe [Abstract] [Full Text]; Voiglio, Eric [Full Text]; Voors, Adriaan A. [Abstract] [Full Text]; Vuagnat, Albert [Abstract] [Full Text]
W: Wang, Jeffrey [Full Text]; Warbuton, Raymond [Full Text]; Wassermann, Klaus [Abstract] [Full Text]; Watarida, Shoji [Full Text]; Weder, Walter [Abstract] [Full Text]; Wehrmacher, William H. [Abstract] [Full Text]; Weinberg, Alan [Abstract] [Full Text]; Weinberg, Alan D. [Abstract] [Full Text]; Weinert, Lynn [Abstract] [Full Text]; Weiss, Stuart J. [Abstract] [Full Text]; Woodcock, Ashley [Full Text]; Wurster, Robert D. [Abstract] [Full Text]
Y: Yamamoto, Rie [Full Text]; Yamazato, Ario [Full Text]; Yang, Luojia [Abstract] [Full Text]; Yasui, Hisataka [Abstract] [Full Text]; Ye, Jian [Abstract] [Full Text]; Yonan, Nizar [Full Text]; Yoshida, Yuki [Full Text]
Z: Zerkowski, Hans-Reinhard [Full Text]; Zollinger, Andreas [Abstract] [Full Text]