JTCS -- Index by Author (Nov 1997; 114, Number 5)

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Year:		Vol:		Page:

Index by Author: Nov 1997; 114 (5) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Acar, Christophe [Full Text]; Altorki, Nasser K. [Abstract] [Full Text]; Amory, David W. [Full Text]; Anderson, Robert H. [Full Text]; Andreani, Stefano [Full Text]; Armstrong, Susan [Abstract] [Full Text]; Auden, Steven M. [Abstract] [Full Text]; Austin, Erle H. [Abstract] [Full Text]
B: Béland, Marie J. [Abstract] [Full Text]; Bartelings, Margot M. [Full Text]; Bedini, Amedeo V. [Full Text]; Beitzke, Albrecht [Full Text]; Bernat, Robert [Full Text]; Bernstein, Matthew [Abstract] [Full Text]; Boasquevisque, Carlos H. R. [Abstract] [Full Text]; Boasquevisque, Carlos H. R. [Abstract] [Full Text]; Bogers, Ad J. J. C. [Full Text]; Botney, Mitchell D. [Abstract] [Full Text]; Botney, Mitchell D. [Abstract] [Full Text]; Buda, Tiffany [Abstract] [Full Text]; Busch, Thomas [Full Text]
C: Carey, Robert W. [Abstract] [Full Text]; Cecere, Renzo [Abstract] [Full Text]; Champsaur, Gérard [Abstract] [Full Text]; Champsaur, G. [Full Text]; Chapman, William H. H. [Abstract] [Full Text]; Cheppo, Caryn D. [Abstract] [Full Text]; Chitwood, W. Randolph [Abstract] [Full Text]; Choi, Noah C. [Abstract] [Full Text]; Clements, Fiona M. [Full Text]; Cooper, Joel D. [Abstract] [Full Text]; Cooper, Joel D. [Abstract] [Full Text]; Corlett, Karen M. [Abstract] [Full Text]; Curtil, A. [Full Text]
D: Dalichau, Harald [Full Text]; David, Tirone E. [Abstract] [Full Text]; Day, Ronald [Full Text]; De Giacomo, Tiziano [Abstract] [Full Text]; Dobell, Anthony R. C. [Abstract] [Full Text]; DSc, [Abstract] [Full Text]
E: Ebels, Tjark [Full Text]; Edmonds, Harvey L. [Abstract] [Full Text]; El-Khoury, Elie [Abstract] [Full Text]; Elbeery, Joseph R. [Abstract] [Full Text]; Esmailzadeh, Bahman [Full Text]; Evans, John [Full Text]
F: Faidutti, Bernard [Full Text]; Fazi, Paola [Abstract] [Full Text]; Ferguson, Mark K. [Abstract] [Full Text]; Ferson, Peter [Abstract] [Full Text]; Finet, G. [Full Text]; Flaishman, Isac [Abstract] [Full Text]; Foegh, Marie L. [Abstract] [Full Text]; Franck, Michel [Abstract] [Full Text]
G: Gamillscheg, Andreas [Full Text]; Gittenberger-de Groot, Adriana C. [Full Text]; Goormastic, Marlene [Abstract] [Full Text]; Grillo, Hermes C. [Abstract] [Full Text]; Grocott, Hilary P. [Full Text]; Grossbard, Michael L. [Abstract] [Full Text]
H: Hanley, Frank L. [Abstract] [Full Text]; Hazekamp, Mark G. [Full Text]; Herse, Bernd [Full Text]; Hokken, Raymond B. [Full Text]; Hutter, Paul A. [Full Text]; Huysmans, Hans A. [Full Text]
I: Inoue, Kanji [Full Text]; Iwase, Tomoyuki [Full Text]
J: Jacobs, Marshall L. [Full Text]; Jutras, Luc [Abstract] [Full Text]
K: Kalangos, Afksendiyos [Full Text]; Kanazawa, Toshiyuki [Full Text]; Kawada, Noriyasu [Full Text]; Keenan, Robert [Abstract] [Full Text]; Khatchatourian, Gregory [Full Text]; Kim, Richard [Abstract] [Full Text]; Kirchhoff, Paul Gerhard [Full Text]; Kouchoukos, Nicholas [Full Text]; Kreitmann, Bernard [Abstract] [Full Text]; Kuo, James [Abstract] [Full Text]; Kurth, C. Dean [Full Text]
L: Landreneau, Rodney [Abstract] [Full Text]; Laussen, Peter C. [Full Text]; Lee, Teng C. [Abstract] [Full Text]; Lefrak, Edward A. [Abstract] [Full Text]; Lou, Hong [Abstract] [Full Text]; Lowe, James E. [Full Text]; Lowry, Edward [Full Text]; Luketich, James D. [Abstract] [Full Text]; Lust, Robert M. [Abstract] [Full Text]; Lynch, Thomas J. [Abstract] [Full Text]
M: Mariani, Massimo A. [Full Text]; Martinot, Stéphane [Abstract] [Full Text]; Mathisen, Douglas J. [Abstract] [Full Text]; McCarthy, Patrick M. [Abstract] [Full Text]; McElhinney, Doff B. [Abstract] [Full Text]; Meijboom, Erik-Jan [Full Text]; Metras, Dominique [Abstract] [Full Text]; Meybehm, Monika [Full Text]; Misawa, Yoshio [Full Text]; Moncure, Ashby C. [Abstract] [Full Text]; Monsuez, Jean-Jacques [Full Text]; Mora, Bassem N. [Abstract] [Full Text]; Moran, Jon F. [Abstract] [Full Text]; Motomura, Noboru [Abstract] [Full Text]; MSN, [Abstract] [Full Text]
N: Nagashima, Mitsugi [Full Text]; Nakamura, Yuzuru [Full Text]; Naunheim, Keith S. [Abstract] [Full Text]; Newman, Mark F. [Full Text]; Nguyen, Ninh [Abstract] [Full Text]; Nicolson, Susan C. [Full Text]; Nietupski, Jennifer B. [Abstract] [Full Text]; Ninet, Jean [Abstract] [Full Text]; Niznik, Greg [Abstract] [Full Text]; Nollert, Georg [Full Text]
O: Osburn, William O. [Abstract] [Full Text]; Ottenkamp, Jaap [Full Text]
P: Pannetier-Mille, Adrienne [Abstract] [Full Text]; Panos, Aristotelis [Full Text]; Paquet, Marc [Abstract] [Full Text]; Patterson, G. Alexander [Abstract] [Full Text]; Patterson, G. Alexander [Abstract] [Full Text]; Peterson, David [Abstract] [Full Text]; Pfeiffer, Dietrich [Full Text]
R: Ramwell, Peter W. [Abstract] [Full Text]; Ravasi, Gianni [Full Text]; Reddy, V. Mohan [Abstract] [Full Text]; Rendina, Erino A. [Abstract] [Full Text]; Riberi, Alberto [Abstract] [Full Text]; Ricci, Costante [Abstract] [Full Text]; Rigler, Bruno [Full Text]; Robin, Jacques [Abstract] [Full Text]; Robin, J. [Full Text]; Rusch, Valerie W. [Abstract] [Full Text]
S: Saito, Satoshi [Abstract] [Full Text]; Salasidis, Gary [Abstract] [Full Text]; Sato, Mitsuru [Full Text]; Scalia, Gregory M. [Abstract] [Full Text]; Schauer, Philip [Abstract] [Full Text]; Scheule, Ronald K. [Abstract] [Full Text]; Scheule, Ronald K. [Abstract] [Full Text]; Schoof, Paul H. [Full Text]; Sehic, Aida [Abstract] [Full Text]; Seremet, Vedad [Abstract] [Full Text]; Shin'oka, Toshiharu [Full Text]; Shum-Tim, Dominique [Full Text]; Silverman, Norman H. [Abstract] [Full Text]; Sirbu, Horia [Full Text]; Skinner, David B. [Full Text]; Smedira, Nicholas G. [Abstract] [Full Text]; Soslow, Robert A. [Abstract] [Full Text]; Sowell, Michael K. [Abstract] [Full Text]; Sponsor:, [Abstract] [Full Text]; Sponsor:, [Abstract] [Full Text]; Starling, Randall C. [Abstract] [Full Text]; Steven, James M. [Full Text]; Strengers, Jan L. M. [Full Text]; Suys, Bert E. [Full Text]
T: Tabbutt, Sarah [Full Text]; Tamaki, Shunich [Full Text]; Tchervenkov, Christo I. [Abstract] [Full Text]; Thomas, James D. [Abstract] [Full Text]; Tronc, F. [Full Text]; Tronc, François [Abstract] [Full Text]
U: Ueno, Katsuya [Full Text]; Urso, Kathleen [Abstract] [Full Text]
V: Valente, Maurizio [Full Text]; Vargo, Rita L. [Abstract] [Full Text]; Vedrinne, Catherine [Abstract] [Full Text]; Vedrinne, C. [Full Text]; Venuta, Federico [Abstract] [Full Text]; Vittecoq, Daniel [Full Text]
W: Wain, John C. [Abstract] [Full Text]; Waterbolk, Tjalling W. [Full Text]; Wernert, François [Abstract] [Full Text]; Winkler, Kai [Full Text]; Witchitz, Serge [Full Text]; Wixon, Christopher L. [Abstract] [Full Text]; Wong, James [Abstract] [Full Text]; Wright, Cameron D. [Abstract] [Full Text]
Y: Yamagishi, Masaaki [Full Text]; Yamazato, Ario [Full Text]; Yano, Motoki [Abstract] [Full Text]; Yao, John-Godson [Abstract] [Full Text]; Ying, Liang [Abstract] [Full Text]; Yoshida, Yuki [Full Text]; Young, James B. [Abstract] [Full Text]
Z: Zhang, Wei [Abstract] [Full Text]; Zobel, Gerfried [Full Text]