JTCS -- Index by Author (Feb 1998; 115, Number 2)

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	Author:		Keyword(s):
Year:		Vol:		Page:

Index by Author: Feb 1998; 115 (2) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Abe, Tadaaki [Full Text]; Adachi, Katsutoshi [Full Text]; Allen, Mark S. [Abstract] [Full Text]; Allen, Bradley S. [Abstract] [Full Text]; Altorki, Nasser [Abstract] [Full Text]; Alvarez, John M. [Full Text]; Anderson, Robert H. [Abstract] [Full Text]; Arditis, I. I. [Full Text]; Austin, John H. M. [Full Text]; Autschbach, Rüdiger [Full Text]
B: Bach, David S. [Abstract] [Full Text]; Bains, Manjit S. [Abstract] [Full Text]; Battellini, Roberto [Full Text]; Baumann, F. Gregory [Abstract] [Full Text]; Becker, Anton E. [Abstract] [Full Text]; Bennett, Edward V. [Full Text]; Bisbos, A. D. [Full Text]; Bittner, Hartmuth B. [Abstract] [Full Text]; Blumberg, David [Abstract] [Full Text]; Bolling, Kirk S. [Abstract] [Full Text]; Bolling, Steven F. [Abstract] [Full Text]; Bove, Edward L. [Abstract] [Full Text]; Brandenberger, Gabrielle [Full Text]; Brenner, Matthew [Abstract] [Full Text]; Burt, Michael E. [Abstract] [Full Text]; Burt, Michael E. [Abstract] [Full Text]; Buttenheim, Patricia M. [Abstract] [Full Text]
C: Cahill, Paul A. [Abstract] [Full Text]; Caldarone, Christopher A. [Full Text]; Calhoon, John H. [Full Text]; Chai, Paul J. [Abstract] [Full Text]; Chai, Paul J. [Abstract] [Full Text]; Chanda, Jyotirmay [Full Text]; Charpentier, Arnaud [Full Text]; Chen, John C. [Abstract] [Full Text]; Chen, Edward P. [Abstract] [Full Text]; Clark, Stephen C. [Full Text]; Cohen, Alan H. [Abstract] [Full Text]; Coles, John G. [Full Text]; Colvin, Stephen B. [Abstract] [Full Text]; Cooper, Joel D. [Abstract] [Full Text]; Coulson, Alan [Full Text]; Crookes, Peter F. [Abstract] [Full Text]; Culliford, Alfred T. [Abstract] [Full Text]
D: Daggett, C. William [Abstract] [Full Text]; Daggett, C. William [Abstract] [Full Text]; Dark, John H. [Full Text]; Davies, Michael J. [Abstract] [Full Text]; Davis, R. Duane [Abstract] [Full Text]; de Leval, Marc R. [Abstract] [Full Text]; de Varennes, Benoît [Full Text]; DeBois, William [Abstract] [Full Text]; Deeb, G. Michael [Abstract] [Full Text]; Delianides, Julie [Abstract] [Full Text]; DeMeester, Tom R. [Abstract] [Full Text]; Depre, Christophe [Full Text]; Deschamps, Claude [Abstract] [Full Text]; Diegeler, Anno [Full Text]; Dion, Robert [Full Text]; Doty, John R. [Abstract] [Full Text]; Doty, Donald B. [Abstract] [Full Text]; Downey, Robert J. [Abstract] [Full Text]
E: Edwards, Niloo M. [Full Text]; Eisenmann, Bernard [Full Text]; Elliott, Martin J. [Abstract] [Full Text]; Epailly, Eric [Full Text]; Esposito, Rick [Abstract] [Full Text]
F: Falk, Volkmar [Full Text]; Feinberg, Harold [Abstract] [Full Text]; Feuerstein, Irwin R. [Abstract] [Full Text]; Fischel, Richard J. [Abstract] [Full Text]; Flores, Jean H. [Abstract] [Full Text]; Follenius, Marguerite [Full Text]; Folz, Rodney J. [Abstract] [Full Text]
G: Gadenstätter, Michael [Abstract] [Full Text]; Galloway, Aubrey C. [Abstract] [Full Text]; Gammie, James S. [Abstract] [Full Text]; Ganjoo, Anoop K. [Full Text]; Gassel, Adam [Abstract] [Full Text]; Gaynor, J. William [Abstract] [Full Text]; Gelb, Arthur [Abstract] [Full Text]; Geny, Bernard [Full Text]; George, Samuel E. [Abstract] [Full Text]; Ginsberg, Robert J. [Abstract] [Full Text]; Gomez, Maureen [Abstract] [Full Text]; Griffith, Bartley P. [Abstract] [Full Text]; Grippo, Maria [Full Text]; Grossi, Eugene A. [Abstract] [Full Text]
H: Haberey, Pascal [Full Text]; Hagen, Jeffrey A. [Abstract] [Full Text]; Halldorsson, Ari [Abstract] [Full Text]; Hambsch, Jörg [Full Text]; Hannan, Robert L. [Abstract] [Full Text]; Hartman, Gregg S. [Abstract] [Full Text]; Hartz, René S. [Abstract] [Full Text]; Hattler, Brack G. [Abstract] [Full Text]; Havaux, Xavier [Full Text]; Helfrich, Craig M. [Full Text]; Helm, Robert [Abstract] [Full Text]; Huddleston, Charles B. [Abstract] [Full Text]; Huh, Joseph [Abstract] [Full Text]
I: Isom, O. Wayne [Abstract] [Full Text]
J: Jaggers, James [Abstract] [Full Text]; Jaggers, James [Abstract] [Full Text]; Johnson, Julie O. [Abstract] [Full Text]; Johnson, Scott B. [Full Text]
K: Katie, Fernando [Abstract] [Full Text]; Keenan, Robert J. [Abstract] [Full Text]; Khoshbin, Espeed [Abstract] [Full Text]; Kim, Young D. [Abstract] [Full Text]; Ko, Wilson [Abstract] [Full Text]; Korst, Robert J. [Abstract] [Full Text]; Kouretas, Peter C. [Abstract] [Full Text]; Kranda, Karen [Abstract] [Full Text]; Kreutzer, Guillermo O. A. [Full Text]; Kreutzer, Christian [Full Text]; Krieger, Karl H. [Abstract] [Full Text]; Kronon, Michael [Abstract] [Full Text]; Kuribayashi, Ryosei [Full Text]; Kurosawa, Hiromi [Abstract] [Full Text]
L: Lang, Samuel J. [Abstract] [Full Text]; Liddicoat, John R. [Abstract] [Full Text]; Lodge, Andrew J. [Abstract] [Full Text]; Lodge, Andrew J. [Abstract] [Full Text]; Lynch, John [Abstract] [Full Text]
M: Mallory, George B. [Abstract] [Full Text]; Manetta, Frank [Full Text]; Martini, Nael [Abstract] [Full Text]; Mason, Rodney J. [Abstract] [Full Text]; McGrath, Michael F. [Abstract] [Full Text]; McKenna,, Robert [Abstract] [Full Text]; Mendeloff, Eric N. [Abstract] [Full Text]; Miller, Jeffrey S. [Abstract] [Full Text]; Milliken, Jeffrey C. [Abstract] [Full Text]; Mohr, Friedrich W. [Full Text]; Moores, Darroch W. O. [Full Text]; Morin, Jean E. [Full Text]; Morita, Kiyozo [Abstract] [Full Text]; Myers, Jeff L. [Abstract] [Full Text]; Myers, Adam K. [Abstract] [Full Text]
N: Najm, Hani K. [Full Text]; Namikawa, Shoji [Full Text]; Nguyen, Khan [Abstract] [Full Text]
O: O'Hara, Maureen [Abstract] [Full Text]
P: Pagani, Francis D. [Abstract] [Full Text]; Pairolero, Peter C. [Abstract] [Full Text]; Pass, Harvey I. [Abstract] [Full Text]; Patterson, G. Alec [Abstract] [Full Text]; Peters, Jeffrey H. [Abstract] [Full Text]; Pham, Si M. [Abstract] [Full Text]; Piquard, François [Full Text]; Plourde, Gilles [Full Text]; Preksto, Dianne [Abstract] [Full Text]; Prommegger, Rupert [Full Text]
R: Rahman, Shaikh [Abstract] [Full Text]; Reardon, Michael J. [Full Text]; Ribakove, Greg H. [Abstract] [Full Text]; Ritter, Manfred P. [Abstract] [Full Text]; Robinson, Lary A. [Abstract] [Full Text]; Roman, Maria Ines [Full Text]; Rosengart, Todd K. [Abstract] [Full Text]; Rusch, Valerie [Abstract] [Full Text]
S: Salazar, Jorge D. [Abstract] [Full Text]; Salzer, Georg Michael [Full Text]; Santiago, Gabriel [Full Text]; Scarborough, John E. [Abstract] [Full Text]; Scarborough, John E. [Abstract] [Full Text]; Schlichter, Andres J. [Full Text]; Schneider, Peter [Full Text]; Shimizu, Shogo [Abstract] [Full Text]; Shimono, Takatsugu [Full Text]; Sitzmann, James V. [Abstract] [Full Text]; Smallhorn, Jeffery [Full Text]; Spanos, P. K. [Full Text]; Spencer, Frank C. [Abstract] [Full Text]; Steinberg, Seth M. [Abstract] [Full Text]; Sudarshan, Catherine D. [Full Text]; Sundaresan, Sudhir [Abstract] [Full Text]; Sweet, Stuart C. [Abstract] [Full Text]
T: Tárnok, Attila [Full Text]; Takao, Motoshi [Full Text]; Temeck, Barbara K. [Abstract] [Full Text]; Tokui, Toshiya [Full Text]; Trastek, Victor F. [Abstract] [Full Text]; Trigt, Peter Van [Abstract] [Full Text]; Trulock, Elbert P. [Abstract] [Full Text]
U: Ündar, Akif [Full Text]; Ullyot, Daniel J. [Full Text]; Ungerleider, Ross M. [Abstract] [Full Text]; Ungerleider, Ross M. [Abstract] [Full Text]
V: Vanoverschelde, Jean L. [Full Text]; Varon, Roald Fernando [Full Text]; Vazquez, Haydee [Full Text]
W: Wallace, Robert B. [Abstract] [Full Text]; Walther, Thomas [Full Text]; Wang, Tingrong [Abstract] [Full Text]; Wang, Yi-Ning [Abstract] [Full Text]; Wernovsky, Gil [Full Text]; Williamson, J. Andrew [Abstract] [Full Text]; Wilson, Archie F. [Abstract] [Full Text]
Y: Yada, Iaso [Full Text]; Yamagishi, Masaaki [Abstract] [Full Text]; Yasuda, Fuyuhiko [Full Text]; Yoong, Benedict [Abstract] [Full Text]; Yuasa, Hiroshi [Full Text]; Yuasa, Uhito [Full Text]