JTCS -- Index by Author (Jun 1998; 115, Number 6)

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	Author:		Keyword(s):
Year:		Vol:		Page:

Index by Author: Jun 1998; 115 (6) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Abe, Koji [Abstract] [Full Text]; Abe, Tomio [Full Text]; Abramovich, C.M. [Full Text]; Amin, Zahid [Full Text]; Armstrong, Susan [Abstract] [Full Text]
B: Bailey, Leonard L. [Abstract] [Full Text]; Bailey, Leonard L. [Abstract] [Full Text]; Bass, John L. [Full Text]; Berry, James M. [Full Text]; Bertolini, Paolo [Abstract] [Full Text]; Biao, Zeng [Abstract] [Full Text]; Brady, Peter W. [Abstract] [Full Text]; Brook, Michael M. [Abstract] [Full Text]; Bruijn, Jan A. [Abstract] [Full Text]
C: Cable, David G. [Abstract] [Full Text]; Caralps, Josep M. [Full Text]; Carreras, Francesc [Full Text]; Carrier, Michel [Abstract] [Full Text]; Carrington, Russell J. [Abstract] [Full Text]; Clark, Stephen C. [Abstract] [Full Text]; Conforti, Massimo [Abstract] [Full Text]; Conti, Vincent R. [Full Text]
D: Dark, John H. [Abstract] [Full Text]; David, Tirone E. [Abstract] [Full Text]; de Heer, Emile [Abstract] [Full Text]; Decoene, Christophe [Full Text]; DeMeester, Tom R. [Abstract] [Full Text]
E: Eisele, David W. [Abstract] [Full Text]
F: Fischer, Adam P. [Abstract] [Full Text]; Flecknell, Paul A. [Abstract] [Full Text]; Foker, John E. [Full Text]
G: Gammie, James [Full Text]; Gittenberger-de Groot, Adriana [Abstract] [Full Text]; Goffin, Yves [Full Text]; Griffith, Bartley [Full Text]; Gundry, Steven R. [Abstract] [Full Text]; Gundry, Steven R. [Abstract] [Full Text]
H: Hagen, Jeffrey A. [Abstract] [Full Text]; Hancock, Wayne W. [Abstract] [Full Text]; Hanley, Frank L. [Abstract] [Full Text]; Hayashi, Takeshi [Abstract] [Full Text]; Hazekamp, Mark G. [Abstract] [Full Text]; He, Guo-Wei [Abstract] [Full Text]; Heitmiller, Richard F. [Abstract] [Full Text]; Horam, Chris J. [Abstract] [Full Text]; Huang, YiFei [Abstract] [Full Text]; Hunyor, Stephen N. [Abstract] [Full Text]; Hurni, Michel [Abstract] [Full Text]; Huysmans, Hans A. [Abstract] [Full Text]
I: III, Julian Waggoner [Abstract] [Full Text]; Ivanov, Joan [Abstract] [Full Text]
K: Kao, Walter G. [Full Text]; Kashem, Mohammed A. [Abstract] [Full Text]; Kauer, Werner K. [Abstract] [Full Text]; Kawaguchi, Osamu [Abstract] [Full Text]; Khanna, Rakesh [Abstract] [Full Text]; Kurusz, Mark [Full Text]; Kuwaki, Kenji [Full Text]
L: Lanier, William L. [Abstract] [Full Text]; Lansing, Allan M. [Full Text]; Lee, Myles Edwin [Full Text]; Lick, Scott D. [Full Text]; Luciani, Giovanni Battista [Abstract] [Full Text]; Lytle, B.W. [Full Text]
M: McFadden, P. Michael [Full Text]; Majorie, Susan [Full Text]; Martí, Vicens [Full Text]; Martineau, Raymond [Abstract] [Full Text]; Matsumiya, Goro [Abstract] [Full Text]; Mattea, Annette [Full Text]; Mazzucco, Alessandro [Abstract] [Full Text]; McElhinney, Doff B. [Abstract] [Full Text]; McQuone, Shelly J. [Abstract] [Full Text]; Morimoto, Toro [Abstract] [Full Text]; Morishita, Kiyofumi [Full Text]; Mueller, Xavier M. [Abstract] [Full Text]; Murase, Mitsuya [Abstract] [Full Text]; Muratore, Pierluigi [Abstract] [Full Text]
N: Nair, R. Unnikrishnan [Full Text]; Nessi, Franco [Abstract] [Full Text]
O: Ochsner, John L. [Full Text]; Okada, Masayoshi [Abstract] [Full Text]; Omran, Ahmad [Abstract] [Full Text]
P: Pellerin, Michel [Abstract] [Full Text]; Pelletier, L. Conrad [Abstract] [Full Text]; Peters, Jeffrey H. [Abstract] [Full Text]; Phoon, Colin K. [Abstract] [Full Text]; Piccione, William [Full Text]; Prat, Alain [Full Text]
R: R. Unnikrishnan Nair, MS, FRCS, [Full Text]; Rabbia, Claudio [Abstract] [Full Text]; Ratliff, N.B. [Full Text]; Razzouk, Anees J. [Abstract] [Full Text]; Reddy, V. Mohan [Abstract] [Full Text]; Robbins, Robert J. [Full Text]; Rocchini, Albert P. [Full Text]; Rodriguez, E. Rene [Full Text]; Romano, Matthew A. [Abstract] [Full Text]; Rossato, Denis [Abstract] [Full Text]; Roughan, Jonathan [Abstract] [Full Text]; Ruchat, Patrick [Abstract] [Full Text]; Ruebben, Alexander [Abstract] [Full Text]
S: Sadahiro, Mitsuaki [Abstract] [Full Text]; Saez de Ibarra, José [Full Text]; Sakurai, Masahiro [Abstract] [Full Text]; Sato, Hiroki [Full Text]; Savio, Daniele [Abstract] [Full Text]; Savoye, Christine [Full Text]; Schaff, Hartzell V. [Abstract] [Full Text]; Schoof, Paul H. [Abstract] [Full Text]; Schroeder, Darrell R. [Abstract] [Full Text]; Segesser, Ludwig von [Abstract] [Full Text]; Shattuck, O. Howard [Abstract] [Full Text]; Sigel, J.E. [Full Text]; Singer, Raymond L. [Full Text]; Slater, James [Abstract] [Full Text]; Solymoss, B. Charles [Abstract] [Full Text]; Spier, Lawrence [Full Text]; Stumpe, Frank [Abstract] [Full Text]; Sualís, Alfons [Full Text]; Sudarshan, Catherine [Abstract] [Full Text]; Sun, Zhao [Abstract] [Full Text]
T: Tabayashi, Koichi [Abstract] [Full Text]; Tam, R. K. W. [Full Text]; Tettoni, Serena [Abstract] [Full Text]; Tevaearai, Hendrik T. [Abstract] [Full Text]; Toyoda, Yoshiya [Abstract] [Full Text]; Trohman, Richard G. [Full Text]
V: Van Meter, Clifford H. [Full Text]; van Wermeskerken, Gijs [Abstract] [Full Text]; Vecchi, Barbara [Abstract] [Full Text]; Vincentelli, André [Full Text]
W: Wass, C. Thomas [Abstract] [Full Text]; Watson, Thomas J. [Abstract] [Full Text]
X: Xu, He [Abstract] [Full Text]
Y: Yuasa, Takeshi [Abstract] [Full Text]
Z: Zenati, Marco [Full Text]; Zuppan, Craig W. [Abstract] [Full Text]