JTCS -- Index by Author (Dec 2000; 120, Number 6)

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	Author:		Keyword(s):
Year:		Vol:		Page:

Index by Author: Dec 2000; 120 (6) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Abe, Koji [Abstract] [Full Text]; Albrecht, Robert [Full Text]; Allman, Richard M. [Abstract] [Full Text]; Amin, Zahid [Abstract] [Full Text]; Anttila, Vesa [Abstract] [Full Text]; Applebaum, Robert M. [Full Text]; Attar, Safuh [Abstract] [Full Text]; Austin, Erle H. [Full Text]; Avenia, Nicola [Abstract] [Full Text]
B: Baumann, F. Gregory [Full Text]; Berdat, Pascal A. [Abstract] [Full Text]; Bergeron, Michel G. [Abstract] [Full Text]; Bozkurt, Durmus [Abstract] [Full Text]; Brown, Jamie [Abstract] [Full Text]
C: Çetin, Güven [Abstract] [Full Text]; Caldarone, Christopher A. [Abstract] [Full Text]; Cambier, J. P. [Abstract] [Full Text]; Cardarelli, Marcelo G. [Abstract] [Full Text]; Carrel, Thierry [Abstract] [Full Text]; Chapman, William H. [Full Text]; Chatterjee, Tushar [Abstract] [Full Text]; Chitwood, W. Randolph [Full Text]; Clarke, David R. [Full Text]; Coles, John G. [Abstract] [Full Text]; Colvin, Stephen B. [Full Text]; Croteau, Daniel [Abstract] [Full Text]
D: Daddi, Giuliano [Abstract] [Full Text]; Daddi, Niccolò [Abstract] [Full Text]; de Haan, Peter [Abstract] [Full Text]; De Leyn, P. [Abstract] [Full Text]; De Wever, W. [Abstract] [Full Text]; Downing, Stephen W. [Abstract] [Full Text]; Droghetti, Andrea [Abstract] [Full Text]
E: Elbeery, Joseph E. [Full Text]
F: Flamen, P. [Abstract] [Full Text]; Freedom, Robert M. [Abstract] [Full Text]
G: Gülhan, Erkmen [Abstract] [Full Text]; Galbraith, Andrew J. [Abstract] [Full Text]; Galloway, Aubrey C. [Full Text]; Grossi, Eugene A. [Full Text]
H: Hamacher, Jürg [Abstract] [Full Text]; Hanley, Frank L. [Abstract] [Full Text]; Hatsuoka, Shinichi [Abstract] [Full Text]; Hayashi, Takeshi [Abstract] [Full Text]; Higami, Tetsuya [Abstract] [Full Text]; Hillinger, Sven [Abstract] [Full Text]; Hirvonen, Jorma [Abstract] [Full Text]; Holman, William L. [Abstract] [Full Text]; Hulscher, Jan B. F. [Abstract] [Full Text]; Hunter, Peter J. [Abstract] [Full Text]
J: Jamieson, Stuart W. [Abstract] [Full Text]; Juvonen, Tatu [Abstract] [Full Text]
K: Khalil, Philipe N. [Abstract] [Full Text]; Kiefe, Catarina I. [Abstract] [Full Text]; Kim, Victor [Full Text]; Kimmel, Wendy A. [Full Text]; Kiviluoma, Kai [Abstract] [Full Text]; Kloek, Jaap [Abstract] [Full Text]; Krasinskas, Alyssa M. [Abstract] [Full Text]; Kreisel, Daniel [Abstract] [Full Text]; Kriett, Jolene M. [Abstract] [Full Text]; Kurul, Ismail Cüneyt [Abstract] [Full Text]
L: LaPietra, Angelo [Full Text]; LeGrice, Ian J. [Abstract] [Full Text]; Lerut, A. [Abstract] [Full Text]; Li, Ren-Ke [Full Text]; Li, Qing [Abstract] [Full Text]
M: Madani, Michael M. [Abstract] [Full Text]; Maes, A. [Abstract] [Full Text]; Martin, David P. [Abstract] [Full Text]; Maruo, Ayako [Abstract] [Full Text]; Mattox, Kenneth L. [Full Text]; Mayer, John E. [Abstract] [Full Text]; McCrindle, Brian W. [Abstract] [Full Text]; McElhinney, Doff B. [Abstract] [Full Text]; McGiffin, David C. [Abstract] [Full Text]; McGiffin, David C. [Abstract] [Full Text]; McLaughlin, Joseph S. [Abstract] [Full Text]; Meguro, Taiichiro [Abstract] [Full Text]; Meier, Bernhard [Abstract] [Full Text]; Mennander, Ari [Abstract] [Full Text]; Milhoan, Kirk [Abstract] [Full Text]; Moore, Philip [Abstract] [Full Text]; Moran, Adrian M. [Abstract] [Full Text]; Mortelmans, L. [Abstract] [Full Text]; Moses, Marsha A. [Abstract] [Full Text]
N: Nagashima, Mitsugi [Abstract] [Full Text]; Nielsen, Vance G. [Abstract] [Full Text]; Nifong, L. Wiley [Full Text]
O: Obertop, Hugo [Abstract] [Full Text]; Ogawa, Kyoichi [Abstract] [Full Text]; Ohtonen, Pasi [Abstract] [Full Text]
P: Pacifico, Albert D. [Abstract] [Full Text]; Peeters, M. [Abstract] [Full Text]; Peterson, Eric D. [Abstract] [Full Text]; Pfammatter, Jean-Pierre [Abstract] [Full Text]; Pokela, Matti [Abstract] [Full Text]; Popma, Sicco H. [Abstract] [Full Text]; Puma, Francesco [Abstract] [Full Text]
R: Ragusa, Mark [Abstract] [Full Text]; Reddy, V. Mohan [Abstract] [Full Text]; Remes, Elina [Abstract] [Full Text]; Ribakove, Greg H. [Full Text]; Rimpiläinen, Jussi [Abstract] [Full Text]; Rodriguez, Aurelio [Abstract] [Full Text]; Rosengard, Bruce R. [Abstract] [Full Text]
S: Saginur, Raphael [Abstract] [Full Text]; Sakamoto, Takahiko [Abstract] [Full Text]; Sakurai, Masahiro [Abstract] [Full Text]; Schmid, Ralph A. [Abstract] [Full Text]; Schoen, Frederick J. [Abstract] [Full Text]; Setoguchi, Yasuhiro [Abstract] [Full Text]; Shida, Tsutomu [Abstract] [Full Text]; Smaill, Bruce H. [Abstract] [Full Text]; Sperling, Jason [Abstract] [Full Text]; Stammberger, Uz [Abstract] [Full Text]; Steinberg, Bryan M. [Full Text]; Stock, Ulrich A. [Abstract] [Full Text]; Svensson, Lars G. [Full Text]; Szeto, Wilson Y. [Abstract] [Full Text]
T: Tabayashi, Koichi [Abstract] [Full Text]; Tastepe, Irfan [Abstract] [Full Text]; ter Hofstede, Ester [Abstract] [Full Text]; Thistlethwaite, Patricia A. [Abstract] [Full Text]; Topçu, Salih [Abstract] [Full Text]
U: Urbani, Moira [Abstract] [Full Text]; Ursomanno, Patricia [Full Text]
V: Vacanti, Joseph P. [Abstract] [Full Text]; Vainionpää, Vilho [Abstract] [Full Text]; Van Arsdell, Glen S. [Abstract] [Full Text]; Van Cutsem, E. [Abstract] [Full Text]; van Lanschot, J. Jan B. [Abstract] [Full Text]; Van Raemdonck, D. [Abstract] [Full Text]
W: Wallace, Douglas C. [Abstract] [Full Text]; Webb, Gary [Abstract] [Full Text]; Whitman, Glenn J. R. [Abstract] [Full Text]; Williams, William G. [Abstract] [Full Text]; Windecker, Stefan [Abstract] [Full Text]
Y: Yaginuma, Gen-ya [Abstract] [Full Text]; Yamashita, Teruo [Abstract] [Full Text]; Yau, Terrence M. [Full Text]; Young, Alistair A. [Abstract] [Full Text]; Young, James A. [Full Text]