JTCS -- Index by Author (123 [4])

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	Author:		Keyword(s):
Year:		Vol:		Page:

Index by Author: Apr 2002; 123 (4) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Adams, David H. [Full Text]; Aldea, Gabriel S. [Abstract] [Full Text]; Allen, Mark S. [Abstract] [Full Text]; Anderson, Curtis [Full Text]; Anderson, Robert H. [Abstract] [Full Text]; Angouras, Dimitrios [Abstract] [Full Text]; Anttila, Vesa [Abstract] [Full Text]; Ardehali, Abbas [Abstract] [Full Text]
B: Barankay, A. [Abstract] [Full Text]; Barnes, A. [Abstract] [Full Text]; Bauer, Erwin P. [Full Text]; Bellinger, David C. [Abstract] [Full Text]; Berg, Georg [Abstract] [Full Text]; Berg, Todd A. [Abstract] [Full Text]; Bernhard, A. [Abstract] [Full Text]; Beyersdorf, Friedhelm [Abstract] [Full Text]; Biancari, Fausto [Abstract] [Full Text]; Blackstone, Eugene H. [Full Text]; Blanche, Carlos [Abstract] [Full Text]; Blanche, Dominique A. [Abstract] [Full Text]; Bohle, Rainer M. [Full Text]; Bonavida, Benjamin [Abstract] [Full Text]; Bonilla, Luis F. [Abstract] [Full Text]; Borst, Cornelius [Abstract] [Full Text]; Braun, S. L. [Abstract] [Full Text]; Broekhuis, Eli [Full Text]; Buchan, Keith [Abstract] [Full Text]; Buijsrogge, Marc P. [Abstract] [Full Text]; Burkhart, Harold M. [Abstract] [Full Text]; Butchart, Eric G. [Abstract] [Full Text]
C: Carrel, Thierry P. [Abstract] [Full Text]; Cerrina, Jacques [Abstract] [Full Text]; Chandler, Wayne L. [Abstract] [Full Text]; Chapelier, Alain [Abstract] [Full Text]; Cope, Jeffrey T. [Full Text]; Coselli, Joseph S. [Full Text]; Crockett, Gregory I. [Abstract] [Full Text]; Curtis, William E. [Abstract] [Full Text]; Czer, Lawrence S. C. [Abstract] [Full Text]
D: Daddi, Niccolò [Abstract] [Full Text]; Dahlem, Peter G. [Full Text]; Dartevelle, Philippe [Abstract] [Full Text]; de Leval, Marc R. [Abstract] [Full Text]; Deschamps, Claude [Abstract] [Full Text]; Dewey, Todd M. [Full Text]; Dodge-Khatami, Ali [Full Text]; Dodge-Khatami, Ali [Abstract] [Full Text]; Dunning, John [Full Text]; Duray, Paul H. [Abstract] [Full Text]; Durkin, Amy E. [Abstract] [Full Text]
E: Eckstein, Friedrich S. [Abstract] [Full Text]; Eising, G. P. [Abstract] [Full Text]; Elliott, Martin J. [Abstract] [Full Text]; Englberger, Lars [Abstract] [Full Text]; Ettner, U. [Abstract] [Full Text]
F: Fadel, Elie [Abstract] [Full Text]; Farivar, R. Saeid [Full Text]; Farr, A. L. [Abstract] [Full Text]; Ferguson, Mark K. [Abstract] [Full Text]; Figg, William D. [Abstract] [Full Text]; Filsoufi, Farzan [Full Text]; Fischbein, Michael P. [Abstract] [Full Text]; Fishbein, Michael C. [Abstract] [Full Text]; Fisher, Bradley A. [Abstract] [Full Text]; Flynn, Bernard M. [Abstract] [Full Text]; Forbess, Joseph M. [Abstract] [Full Text]; Franco-Cerceda, Anders [Full Text]
G: Gil-Jaurena, Juan Miguel [Abstract] [Full Text]; Goldman, Allan P. [Abstract] [Full Text]; Gründeman, Paul F. [Abstract] [Full Text]; Grunkemeier, Gary L. [Abstract] [Full Text]
H: Haas, F. [Abstract] [Full Text]; Handke, Michael [Abstract] [Full Text]; Hanley, Frank L. [Abstract] [Full Text]; Hazekamp, Mark G. [Full Text]; He, You-Ping [Abstract] [Full Text]; Heikens, Martijn [Abstract] [Full Text]; Heikkinen, Janne [Abstract] [Full Text]; Heilmaier, M. [Abstract] [Full Text]; Hess, J. [Abstract] [Full Text]; Hirvonen, Jorma [Abstract] [Full Text]; Hoercher, Katherine [Full Text]; Howe, Robert J. [Abstract] [Full Text]
I: Ichinose, Yukito [Abstract] [Full Text]; Immer, Franz F. [Abstract] [Full Text]; Irie, Yoshihito [Abstract] [Full Text]; Ishino, Kozo [Abstract] [Full Text]
J: Jäntti, Ville [Abstract] [Full Text]; Jonas, Richard A. [Abstract] [Full Text]; Juvonen, Tatu [Abstract] [Full Text]
K: Kamlot, Andreas [Abstract] [Full Text]; Kanaan, Samer A. [Abstract] [Full Text]; Kasahara, Shingo [Abstract] [Full Text]; Kato, Harubumi [Abstract] [Full Text]; Kawada, Masaaki [Abstract] [Full Text]; Kearney, Brenda [Abstract] [Full Text]; Khonsari, Siavosh [Abstract] [Full Text]; Kiviluoma, Kai [Abstract] [Full Text]; Klövekorn, Wolf P. [Full Text]; Kochamba, Gary S. [Abstract] [Full Text]; Kochs, E. [Abstract] [Full Text]; Kohmoto, Takushi [Abstract] [Full Text]; Koike, Teruaki [Abstract] [Full Text]; Kozower, Benjamin D. [Abstract] [Full Text]; Kramer, Christopher M. [Abstract] [Full Text]; Krishnadasan, B. [Abstract] [Full Text]; Kron, Irving L. [Full Text]; Kuklinski, Daniela [Abstract] [Full Text]; Kumar, Raghavan Nair Suresh [Full Text]
L: Laks, Hillel [Abstract] [Full Text]; Laks, Hillel [Full Text]; Lange, R. [Abstract] [Full Text]; Lange, R. [Abstract] [Full Text]; LeMaire, Scott A. [Full Text]; Lemke, Peter [Full Text]; Leroy-Ladurie, François [Abstract] [Full Text]; Li, Hui-Hua [Abstract] [Full Text]; Luckraz, Heyman [Full Text]; Lutter, Georg [Abstract] [Full Text]
M: Mack, Michael J. [Full Text]; Magee, Mitchell J. [Full Text]; Magliato, Kathy E. [Abstract] [Full Text]; Magovern, James A. [Abstract] [Full Text]; Mahajan, Aman [Full Text]; Malhotra, Sunil P. [Abstract] [Full Text]; Mandana, Kayapanda [Abstract] [Full Text]; Martin, Juergen [Abstract] [Full Text]; McCarthy, Patrick M. [Full Text]; Mee, Roger B. B. [Full Text]; Miller, D. Craig [Abstract] [Full Text]; Miller, Daniel L. [Abstract] [Full Text]; Miller, Owen I. [Abstract] [Full Text]; Missenard, Gilles [Abstract] [Full Text]; Mitsudomi, Tetsuya [Abstract] [Full Text]; Mohanakumar, T. [Abstract] [Full Text]; Mulligan, M. S. [Abstract] [Full Text]; Mussot, Sacha [Abstract] [Full Text]
N: Naidu, B. [Abstract] [Full Text]; Nakagawa, Ken [Abstract] [Full Text]; Nakamura, Kenji [Abstract] [Full Text]; Nguyen, Dao M. [Abstract] [Full Text]; Nichols, Francis C. [Abstract] [Full Text]; Nijdam, Nic C. [Full Text]
O: Ohtsuki, Shin-ichi [Abstract] [Full Text]; Ono, Minoru [Abstract] [Full Text]
P: Paek, S. U. [Abstract] [Full Text]; Pairolero, Peter C. [Abstract] [Full Text]; Parums, Dinah V. [Full Text]; Pasque, Michael K. [Full Text]; Patterson, G. Alexander [Abstract] [Full Text]; Payne, Nicola [Abstract] [Full Text]; Pfeffer, Thomas A. [Abstract] [Full Text]; Pistecky, Peter V. [Abstract] [Full Text]; Pokela, Matti [Abstract] [Full Text]
R: Rao, I. M. [Full Text]; Reddy, V. Mohan [Abstract] [Full Text]; Richter, J. A. [Abstract] [Full Text]; Richter, J. A. [Abstract] [Full Text]; Riemer, R. Kirk [Abstract] [Full Text]; Rimpiläinen, Jussi [Abstract] [Full Text]; Rogers, Walter J. [Abstract] [Full Text]; Romsi, Pekka [Abstract] [Full Text]; Rosengart, M. [Abstract] [Full Text]; Roth, Matthias [Full Text]
S: Sano, Shunji [Abstract] [Full Text]; Santerre, Dean [Full Text]; Savage, Edward B. [Abstract] [Full Text]; Schad, H. [Abstract] [Full Text]; Scheltes, Jules S. [Abstract] [Full Text]; Schmidli, Jürg [Abstract] [Full Text]; Schneeberger, E. William [Abstract] [Full Text]; Schrump, David S. [Abstract] [Full Text]; Shabanie, Afshin [Full Text]; Shin, Yong T. [Abstract] [Full Text]; Sintek, Colleen F. [Abstract] [Full Text]; Soltow, Louise O. [Abstract] [Full Text]; Starling, Randall C. [Full Text]; Suda, Takashi [Abstract] [Full Text]; Suleman, Sam [Abstract] [Full Text]
T: Tada, Hirohito [Abstract] [Full Text]; Tagawa, Tsutomu [Abstract] [Full Text]; Takeuchi, Mamoru [Abstract] [Full Text]; Tassani, P. [Abstract] [Full Text]; Tassani, P. [Abstract] [Full Text]; Terrill, Richard E. [Abstract] [Full Text]; Thelitz, Stephan [Abstract] [Full Text]; Trastek, Victor F. [Abstract] [Full Text]; Trento, Alfredo [Abstract] [Full Text]; Triggs, Christopher M. [Abstract] [Full Text]; Tsang, Victor T. [Abstract] [Full Text]; Tsuchiya, Ryosuke [Abstract] [Full Text]
U: Uhrmeister, Peter [Abstract] [Full Text]
V: Vainionpää, Vilho [Abstract] [Full Text]; Verrier, E. D. [Abstract] [Full Text]; Verrier, Edward D. [Abstract] [Full Text]; Vido, Diane [Abstract] [Full Text]; Visconti, Karen J. [Abstract] [Full Text]; Vocelka, Craig R. [Abstract] [Full Text]; von Rosenstiel, Ines A. [Full Text]; von Samson, Patrick [Abstract] [Full Text]
W: Weiser, Todd S. [Abstract] [Full Text]; White, Jennifer A. [Full Text]; Winkler, C. [Abstract] [Full Text]; Wolf, Randall K. [Abstract] [Full Text]
Y: Yasumitsu, Tsutomu [Abstract] [Full Text]; Yokoi, Kohei [Abstract] [Full Text]; Yoshimura, Hirokuni [Abstract] [Full Text]; Young, James B. [Full Text]; Yun, James [Abstract] [Full Text]; Yun, Kwok L. [Abstract] [Full Text]
Z: Zhai, Suoping [Abstract] [Full Text]; Zile, Michael R. [Abstract] [Full Text]