JTCS -- Index by Author (132 [6])

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Year:		Vol:		Page:

Index by Author: Dec 2006; 132 (6) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Achouh, Paul E. [Abstract] [Full Text]; Ad, Niv [Extract] [Full Text]; Aggoun, Yacine [Extract] [Full Text]; Ahmad, Rizwan [Extract] [Full Text]; Ahmad, Usman [Extract] [Full Text]; Alaoja, Hanna [Abstract] [Full Text]; Alarcó, Antonio [Extract] [Full Text]; Altorki, Nasser K. [Abstract] [Full Text]; Amann-Vesti, Beatrice R. [Extract] [Full Text]; Amir, Gabriel [Abstract] [Full Text]; Anttila, Vesa [Abstract] [Full Text]; Aoki, Tadashi [Abstract] [Full Text]; Asopa, Sanjay [Extract] [Full Text]; Awad, John [Extract] [Full Text]; Azakie, Anthony [Abstract] [Full Text]; Azizzadeh, Ali [Abstract] [Full Text]; Azzaoui, Richard [Extract] [Full Text]
B: Bains, Manjit S. [Abstract] [Full Text]; Ballaux, Philippe K.E.W. [Abstract] [Full Text]; Bapat, Vinayak [Extract] [Full Text]; Baras, Aris [Abstract] [Full Text]; Bauernschmitt, Robert [Extract] [Full Text]; Bauters, Christophe [Extract] [Full Text]; Beauchesne, Luc M. [Extract] [Full Text]; Bédard, Pierre [Extract] [Full Text]; Beghetti, Maurice [Extract] [Full Text]; Biscotti, Charles [Extract] [Full Text]; Blumstein, Howard [Extract] [Full Text]; Boersma, Lukas V.A. [Abstract] [Full Text]; Bogers, Ad J.J.C. [Abstract] [Full Text]; Boltz, Madalane G. [Abstract] [Full Text]; Bonaros, Nikolaos [Abstract] [Full Text]; Bonatti, Johannes [Abstract] [Full Text]; Boodhwani, Munir [Abstract] [Full Text]; Boodhwani, Munir [Abstract] [Full Text]; Boone, Judith [Extract] [Full Text]; Bottio, Tomaso [Extract] [Full Text]; Bryant, Ayesha S. [Abstract] [Full Text]
C: Cerfolio, Robert James [Abstract] [Full Text]; Chirieac, Lucian R. [Extract] [Full Text]; Choi, Yong Seon [Abstract] [Full Text]; Chu, Larry [Abstract] [Full Text]; Chua, Alex [Abstract] [Full Text]; Clements, Richard T. [Abstract] [Full Text]; Coles, John G. [Abstract] [Full Text]; Copin, Marie Christine [Extract] [Full Text]
D: Da Cruz, Eduardo [Extract] [Full Text]; Dahlbacka, Sebastian [Abstract] [Full Text]; Dai, Xiaojing [Abstract] [Full Text]; Daly, Richard C. [Abstract] [Full Text]; Davies, Andrew R. [Extract] [Full Text]; Davies, William [Abstract] [Full Text]; Davis, Corrine R. [Abstract] [Full Text]; de Bonis, Eduardo [Extract] [Full Text]; de la Llana, Ramiro [Extract] [Full Text]; de la Rivière, Aart Brutel [Abstract] [Full Text]; Dearani, Joseph A. [Abstract] [Full Text]; Decoene, Christophe [Extract] [Full Text]; Defauw, Jo J.A.M.T. [Abstract] [Full Text]; Deslauriers, Roxanne [Abstract] [Full Text]; Dhareshwar, Jayesh [Abstract] [Full Text]; Diegeler, Anno [Abstract] [Full Text]; Dilley, Anthony Vincent [Extract] [Full Text]; Dion, Robert A.E. [Abstract] [Full Text]; Dossche, Karl M.E. [Abstract] [Full Text]; Drain, Andrew [Abstract] [Full Text]
E: Edmonds, Lyn [Abstract] [Full Text]; Eichinger, Walter B. [Extract] [Full Text]; Enomoto, Yoshiharu [Abstract] [Full Text]; Enriquez-Sarano, Maurice [Abstract] [Full Text]; Ernst, Jef M.P.G. [Abstract] [Full Text]; Estrera, Anthony L. [Abstract] [Full Text]
F: Fagan, Brian T. [Abstract] [Full Text]; Fallon, John T. [Extract] [Full Text]; Fatimi, Saulat H. [Extract] [Full Text]; Fayad, Georges [Extract] [Full Text]; Feng, Jun [Abstract] [Full Text]; Fineman, Jeffrey R. [Abstract] [Full Text]; Firschke, Christian [Extract] [Full Text]; Flores, Raja [Abstract] [Full Text]
G: Garami, Zsolt [Abstract] [Full Text]; Garrido, Pilar [Extract] [Full Text]; Gerosa, Gino [Extract] [Full Text]; Geuzebroek, Guillaume S.C. [Abstract] [Full Text]; Gong, De-Jun [Abstract] [Full Text]; Gorman, Joseph H. [Abstract] [Full Text]; Gorman, Robert C. [Abstract] [Full Text]; Grant, Peter [Extract] [Full Text]; Griffiths, Anne P. [Abstract] [Full Text]; Gruwel, Marco [Abstract] [Full Text]
H: Haga, Manabu [Abstract] [Full Text]; Hamamoto, Hirotsugu [Abstract] [Full Text]; Hammer, Gregory B. [Abstract] [Full Text]; Hanley, Frank L. [Abstract] [Full Text]; Hannigan, Gregory [Abstract] [Full Text]; Hanyu, Michiya [Extract] [Full Text]; Hashimoto, Kazuhiro [Extract] [Full Text]; Hayashi, Jun-ichi [Abstract] [Full Text]; Hazekamp, Mark G. [Abstract] [Full Text]; He, Youping [Abstract] [Full Text]; Hering, Steffen [Abstract] [Full Text]; Hettich, Ina M. [Extract] [Full Text]; Hickey, Niall [Extract] [Full Text]; Hong, Yong Woo [Abstract] [Full Text]; Huang, Sheng-Dong [Abstract] [Full Text]; Huemmer, Hans P. [Abstract] [Full Text]
I: Ilinski, Oleg [Extract] [Full Text]; Inoue, Yoshito [Extract] [Full Text]; Ishii, Shinichi [Extract] [Full Text]; Iwaki, Hideyuki [Extract] [Full Text]
J: Jackson, Benjamin M. [Abstract] [Full Text]; Jackson, Michael [Abstract] [Full Text]; Javed, Muhammad A. [Extract] [Full Text]; Joshi, Pragnesh [Extract] [Full Text]; Juvonen, Tatu [Abstract] [Full Text]
K: Kaakinen, Timo [Abstract] [Full Text]; Kai, Masashi [Extract] [Full Text]; Kamra, Komal [Abstract] [Full Text]; Kansler, Amanda L. [Abstract] [Full Text]; Karnak, Demet [Extract] [Full Text]; Kashima, Ichiro [Extract] [Full Text]; Kawanishi, Yujiro [Extract] [Full Text]; Kawato, Masahide [Extract] [Full Text]; Keeling, Parnell [Extract] [Full Text]; Kelder, Johannes C. [Abstract] [Full Text]; Kerem, Yaniv [Abstract] [Full Text]; Kerr, Leslie Dubin [Extract] [Full Text]; Kim, Dae Hee [Abstract] [Full Text]; Kimura, Tokuhiro [Extract] [Full Text]; Kitamura, Hideki [Extract] [Full Text]; Kiviluoma, Kai [Abstract] [Full Text]; Kocher, Alfred [Abstract] [Full Text]; Kogon, Brian E. [Abstract] [Full Text]; Koike, Terumoto [Abstract] [Full Text]; Koizumi, Kiyoshi [Extract] [Full Text]; Kolli, Rao [Extract] [Full Text]; Komiyama, Masaki [Extract] [Full Text]; Konstantinov, Igor E. [Extract] [Full Text]; Korst, Robert J. [Abstract] [Full Text]; Kulik, Alexander [Extract] [Full Text]; Kwak, Young Lan [Abstract] [Full Text]; Kypson, Alan P. [Extract] [Full Text]
L: Labinaz, Marino [Extract] [Full Text]; Lachat, Mario [Extract] [Full Text]; Lang-Lazdunski, Loïc [Extract] [Full Text]; Lange, Ruediger [Extract] [Full Text]; Lange, Ruediger [Extract] [Full Text]; Laufer, Guenther [Abstract] [Full Text]; Laurila, Päivi [Abstract] [Full Text]; Le Tourneau, Thierry [Extract] [Full Text]; Lee, Paul C. [Abstract] [Full Text]; Leng, Chua Yeow [Extract] [Full Text]; Lenos, Aristidis [Abstract] [Full Text]; Levvey, Bronwyn J. [Abstract] [Full Text]; Li, Gang [Abstract] [Full Text]; Li, Jian [Abstract] [Full Text]; Li, Jian [Abstract] [Full Text]; Liddicoat, John [Extract] [Full Text]; Lim, Eric [Abstract] [Full Text]; Lim, Lim See [Extract] [Full Text]; Lindemann, Yvonne [Abstract] [Full Text]; Liu, Hongyu [Abstract] [Full Text]; Liu, Xiao-Hong [Abstract] [Full Text]; Lu, Fang-Lin [Abstract] [Full Text]; Lu, Huanzhang [Abstract] [Full Text]; Lu, Yanruo [Abstract] [Full Text]
M: Mäkelä, Jussi [Abstract] [Full Text]; Margreiter, Eva [Abstract] [Full Text]; Martínez-Sanz, Rafael [Extract] [Full Text]; Martinoff, Stefan [Extract] [Full Text]; Masakazu, Nakao [Extract] [Full Text]; Matsuo, Takehiko [Extract] [Full Text]; McCarthy, James P. [Abstract] [Full Text]; Meada, Riad [Abstract] [Full Text]; Mehta, Atul C. [Extract] [Full Text]; Méndez, Rafael [Extract] [Full Text]; Mieno, Shigetoshi [Abstract] [Full Text]; Mieno, Shigetoshi [Abstract] [Full Text]; Miller, Charles C. [Abstract] [Full Text]; Mitchell, R. Scott [Extract] [Full Text]; Modine, Thomas [Extract] [Full Text]; Mommerot, Arnaud [Extract] [Full Text]; Morell, Victor O. [Extract] [Full Text]; Mouroux, Jerome [Extract] [Full Text]; Mullany, Charles J. [Abstract] [Full Text]; Murala, John Santosh Kumar [Extract] [Full Text]; Murthy, Sudish [Extract] [Full Text]
N: Nakagiri, Keitaro [Extract] [Full Text]; Nakano, Jota [Extract] [Full Text]; Nassar, M. Ibrahim [Extract] [Full Text]; Nguyen, Dao M. [Abstract] [Full Text]; Nguyen, Duc M. [Abstract] [Full Text]; Nicholson, Donna [Extract] [Full Text]; Niemelä, Eija [Abstract] [Full Text]; Nomoto, Takuya [Extract] [Full Text]; Numa, Andrew [Extract] [Full Text]
O: O’Riordan, James M. [Extract] [Full Text]; Ochi, Masami [Extract] [Full Text]; Oh, Young Jun [Abstract] [Full Text]; Okabayashi, Hitoshi [Extract] [Full Text]; Okada, Kenji [Extract] [Full Text]; Okita, Yutaka [Extract] [Full Text]; Okuyama, Hiroshi [Extract] [Full Text]; Orszulak, Thomas A. [Abstract] [Full Text]; Oto, Takahiro [Abstract] [Full Text]; Ott, Harald [Abstract] [Full Text]; Ownbey, Robert T. [Extract] [Full Text]
P: Parish, Landi M. [Abstract] [Full Text]; Park, Bernard [Abstract] [Full Text]; Pastorino, Ugo [Extract] [Full Text]; Patel, Anish [Extract] [Full Text]; Pentcheva, Krassimira [Abstract] [Full Text]; Perrault, Louis P. [Extract] [Full Text]; Pfammatter, Thomas [Extract] [Full Text]; Plappert, Theodore [Abstract] [Full Text]; Pop, Daniel [Extract] [Full Text]; Porat, Eyal E. [Abstract] [Full Text]; Port, Jeffrey L. [Abstract] [Full Text]
R: Ramamoorthy, Chandra [Abstract] [Full Text]; Ramamoorthy, Chandra [Abstract] [Full Text]; Ramlawi, Basel [Abstract] [Full Text]; Rauf, Rauend [Abstract] [Full Text]; Raymond, A. Kevin [Extract] [Full Text]; Reddy, V. Mohan [Abstract] [Full Text]; Reddy, Vadiyala M. [Abstract] [Full Text]; Reemtsen, Brian L. [Abstract] [Full Text]; Reingruber, Bertram [Abstract] [Full Text]; Rice, David C. [Extract] [Full Text]; Riemer, R. Kirk [Abstract] [Full Text]; Rinkes, Inne H.M. Borel [Extract] [Full Text]; Rizk, Nabil [Abstract] [Full Text]; Rizzoli, Giulio [Extract] [Full Text]; Rosengard, Bruce R. [Abstract] [Full Text]; Rusch, Valerie [Abstract] [Full Text]
S: Safi, Hazim J. [Abstract] [Full Text]; Saitoh, Masayuki [Abstract] [Full Text]; Sakamoto, Hiroaki [Abstract] [Full Text]; Sakamoto, Yoshimasa [Extract] [Full Text]; Salerno, Tomas A. [Abstract] [Full Text]; Satoh, Koichi [Abstract] [Full Text]; Schachner, Thomas [Abstract] [Full Text]; Schaff, Hartzell V. [Abstract] [Full Text]; Schirmbeck, Eva U. [Extract] [Full Text]; Schlechta, Bernhard [Abstract] [Full Text]; Schoof, Paul H. [Abstract] [Full Text]; Schrump, David S. [Abstract] [Full Text]; Sehgal, Shailen S. [Abstract] [Full Text]; Sellke, Frank W. [Abstract] [Full Text]; Sellke, Frank W. [Abstract] [Full Text]; Shah, Shetal N. [Extract] [Full Text]; Shah, Sonia S. [Extract] [Full Text]; Shamim, Sara [Extract] [Full Text]; Sharma, Mahesh S. [Extract] [Full Text]; Shim, Jae Kwang [Abstract] [Full Text]; Shimizu, Kazuo [Extract] [Full Text]; Simon, Roger W. [Extract] [Full Text]; Snell, Gregory I. [Abstract] [Full Text]; Sodha, Neel [Abstract] [Full Text]; Sodha, Neel R. [Abstract] [Full Text]; Soga, Yoshiharu [Extract] [Full Text]; St. John-Sutton, Martin G. [Abstract] [Full Text]; Starnes, Vaughn A. [Abstract] [Full Text]; Stuge, Oern [Extract] [Full Text]; Sundt, Thoralf M. [Abstract] [Full Text]; Suri, Rakesh M. [Abstract] [Full Text]; Suzuki, Seko [Extract] [Full Text]
T: Taguchi, Shingo [Extract] [Full Text]; Taguchi, Shinichi [Extract] [Full Text]; Takkenberg, Johanna J.M. [Abstract] [Full Text]; Tam, Robert [Extract] [Full Text]; Tanaka, Hiroshi [Extract] [Full Text]; Tarzia, Vincenzo [Extract] [Full Text]; Tian, Ganghong [Abstract] [Full Text]; Tomanek, Boguslaw [Abstract] [Full Text]; Toyabe, Shin-ichi [Abstract] [Full Text]; Treasure, Tom [Extract] [Full Text]; Tsuchida, Masanori [Abstract] [Full Text]; Tsunekawa, Tomohiro [Extract] [Full Text]; Tzankov, Alexandar [Abstract] [Full Text]
U: Ueda, Toshihiko [Extract] [Full Text]; Umehara, Eitaro [Extract] [Full Text]; Urbanski, Paul P. [Abstract] [Full Text]
V: van Hemel, Norbert M. [Abstract] [Full Text]; van Hillegersberg, Richard [Extract] [Full Text]; van Suylen, Robert-Jan [Abstract] [Full Text]; Venissac, Nicolas [Extract] [Full Text]; Venkatraman, Ennapadam [Abstract] [Full Text]; Voisine, Pierre [Abstract] [Full Text]; Voss, Bernhard [Extract] [Full Text]
W: Walsh, Thomas N. [Extract] [Full Text]; Wang, Jian [Abstract] [Full Text]; Wang, Li [Abstract] [Full Text]; Warembourg, Henri [Extract] [Full Text]; Wearden, Peter D. [Extract] [Full Text]; Weber, Peter G. [Abstract] [Full Text]; Weigang, Ernst [Abstract] [Full Text]; Wells, Winfield J. [Abstract] [Full Text]; Wever, Eric F.D. [Abstract] [Full Text]; Will, Albrecht [Extract] [Full Text]; Williams, Glyn D. [Abstract] [Full Text]; Williams, Trevor J. [Abstract] [Full Text]; Wolf, Dominik [Abstract] [Full Text]
X: Xiang, Bo [Abstract] [Full Text]; Xu, Xun-Yu [Abstract] [Full Text]; Xu, Zhi-Yun [Abstract] [Full Text]
Y: Yajima, Toshimi [Extract] [Full Text]; Yamabi, Hideaki [Abstract] [Full Text]; Yamauchi, Shigeo [Extract] [Full Text]; Yamshita, Teruo [Extract] [Full Text]; Yang, Xue Ning [Extract] [Full Text]; Yasui, Toshihiro [Extract] [Full Text]; Yeow, Wen-Shuz [Abstract] [Full Text]; Yuan, Yang [Abstract] [Full Text]
Z: Zacher, Michael [Abstract] [Full Text]; Zeeshan, Ahmad [Abstract] [Full Text]; Zhao, Bao-Zhen [Abstract] [Full Text]; Zhao, Xian-Xian [Abstract] [Full Text]; Zondervan, Pieter E. [Abstract] [Full Text]